Photoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary Zn1-x-yCdxMgySe compounds

An optical characterization of wurtzite Zn1-x-yCdxMgySe crystalline alloys grown by the modified high-pressure Bridgman method has been carried out by temperature-dependent photoluminescence (PL) and contactless electroreflectance (CER) in the temperature range of 103...

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Autores principales: Dumcenco, Dumitru, Levcenco, Sergiu, Huang, Ying-Sheng, Firszt, F., Hsu, H, Tiong, Kwong-Kaw
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Publicado: D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2011
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Acceso en línea:https://doaj.org/article/448c12cb8d804a178a65c4a4f9987719
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spelling oai:doaj.org-article:448c12cb8d804a178a65c4a4f99877192021-11-21T12:02:50ZPhotoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary Zn1-x-yCdxMgySe compounds2537-63651810-648Xhttps://doaj.org/article/448c12cb8d804a178a65c4a4f99877192011-02-01T00:00:00Zhttps://mjps.nanotech.md/archive/2011/article/4302https://doaj.org/toc/1810-648Xhttps://doaj.org/toc/2537-6365An optical characterization of wurtzite Zn1-x-yCdxMgySe crystalline alloys grown by the modified high-pressure Bridgman method has been carried out by temperature-dependent photoluminescence (PL) and contactless electroreflectance (CER) in the temperature range of 10300 K, and photoreflectance (PR) measurements between 300400 K as well as surface photovoltage spectroscopy (SPS) at 300 K. Low temperature PL spectra of the investigated samples consist of an excitonic line, the “edge emission” due to radiative recombination of shallow donor-acceptor pairs and a broad band related to recombination through deep level defects. Three excitonic features, A, B and C, in the vicinity of band edge were observed in the CER and PR spectra. The peak positions of band-edge excitonic features in the PL spectra are shifted slightly towards lower energies as compared to the lowest corresponding transition energies of A exciton determined from CER and PR data. The increase of the CER-PL shift with the increasing of Mg content in the investigated crystals is explained by the rising of compositional disorder causing the smearing of the band-edge energies. In addition, the coincidence of energy positions of features obtained from SPS measurements with excitonic transition energies E0A determined from CER/PR data at 300 K confirm the proper surface treatment of the samples. Dumcenco, DumitruLevcenco, SergiuHuang, Ying-ShengFirszt, F.Hsu, HTiong, Kwong-KawD.Ghitu Institute of Electronic Engineering and NanotechnologiesarticlePhysicsQC1-999ElectronicsTK7800-8360ENMoldavian Journal of the Physical Sciences, Vol 10, Iss 1, Pp 44-51 (2011)
institution DOAJ
collection DOAJ
language EN
topic Physics
QC1-999
Electronics
TK7800-8360
spellingShingle Physics
QC1-999
Electronics
TK7800-8360
Dumcenco, Dumitru
Levcenco, Sergiu
Huang, Ying-Sheng
Firszt, F.
Hsu, H
Tiong, Kwong-Kaw
Photoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary Zn1-x-yCdxMgySe compounds
description An optical characterization of wurtzite Zn1-x-yCdxMgySe crystalline alloys grown by the modified high-pressure Bridgman method has been carried out by temperature-dependent photoluminescence (PL) and contactless electroreflectance (CER) in the temperature range of 10300 K, and photoreflectance (PR) measurements between 300400 K as well as surface photovoltage spectroscopy (SPS) at 300 K. Low temperature PL spectra of the investigated samples consist of an excitonic line, the “edge emission” due to radiative recombination of shallow donor-acceptor pairs and a broad band related to recombination through deep level defects. Three excitonic features, A, B and C, in the vicinity of band edge were observed in the CER and PR spectra. The peak positions of band-edge excitonic features in the PL spectra are shifted slightly towards lower energies as compared to the lowest corresponding transition energies of A exciton determined from CER and PR data. The increase of the CER-PL shift with the increasing of Mg content in the investigated crystals is explained by the rising of compositional disorder causing the smearing of the band-edge energies. In addition, the coincidence of energy positions of features obtained from SPS measurements with excitonic transition energies E0A determined from CER/PR data at 300 K confirm the proper surface treatment of the samples.
format article
author Dumcenco, Dumitru
Levcenco, Sergiu
Huang, Ying-Sheng
Firszt, F.
Hsu, H
Tiong, Kwong-Kaw
author_facet Dumcenco, Dumitru
Levcenco, Sergiu
Huang, Ying-Sheng
Firszt, F.
Hsu, H
Tiong, Kwong-Kaw
author_sort Dumcenco, Dumitru
title Photoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary Zn1-x-yCdxMgySe compounds
title_short Photoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary Zn1-x-yCdxMgySe compounds
title_full Photoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary Zn1-x-yCdxMgySe compounds
title_fullStr Photoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary Zn1-x-yCdxMgySe compounds
title_full_unstemmed Photoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary Zn1-x-yCdxMgySe compounds
title_sort photoluminescence, modulation spectroscopy and surface photovoltage characterization of quaternary zn1-x-ycdxmgyse compounds
publisher D.Ghitu Institute of Electronic Engineering and Nanotechnologies
publishDate 2011
url https://doaj.org/article/448c12cb8d804a178a65c4a4f9987719
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