Phase Segmentation in Atom-Probe Tomography Using Deep Learning-Based Edge Detection
Abstract Atom-probe tomography (APT) facilitates nano- and atomic-scale characterization and analysis of microstructural features. Specifically, APT is well suited to study the interfacial properties of granular or heterophase systems. Traditionally, the identification of the interface between, for...
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Autores principales: | Sandeep Madireddy, Ding-Wen Chung, Troy Loeffler, Subramanian K. R. S. Sankaranarayanan, David N. Seidman, Prasanna Balaprakash, Olle Heinonen |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2019
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Materias: | |
Acceso en línea: | https://doaj.org/article/44bbc6b308d1471da03b8e1a1ab3c668 |
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