Edge-Based Detection of Varroosis in Beehives with IoT Devices with Embedded and TPU-Accelerated Machine Learning

One of the causes of mortality in bees is varroosis, a bee disease caused by the <i>Varroa destructor</i> mite. <i>Varroa destructor</i> mites may occur suddenly in beehives, spread across them, and impair bee colonies, which finally die. Edge IoT (Internet of Things) devices...

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Bibliographic Details
Main Authors: Dariusz Mrozek, Rafał Gȯrny, Anna Wachowicz, Bożena Małysiak-Mrozek
Format: article
Language:EN
Published: MDPI AG 2021
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Online Access:https://doaj.org/article/44dc3c191d6245b2965b595b90a75176
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