Study the Structure Properties of SemiconductorFilm Multilayered

In this research was study the effect of increasing the number of layers of the semiconductor films as PbS on the average grain sizes and illustrate the relationship between the increase in the average grain size and thickness of the membrane, and membrane was prepared using the easy and simple and...

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Autores principales:	Hanaa Arer Al.Kaisy, Hind Basil Al-Atraqji
Formato:	article
Lenguaje:	EN
Publicado:	Al-Khwarizmi College of Engineering – University of Baghdad 2010
Materias:	Chemical engineering TP155-156 Engineering (General). Civil engineering (General) TA1-2040
Acceso en línea:	https://doaj.org/article/44f9c26b7c1045f5bb55801786cd5c20
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id	oai:doaj.org-article:44f9c26b7c1045f5bb55801786cd5c20
record_format	dspace
spelling	oai:doaj.org-article:44f9c26b7c1045f5bb55801786cd5c202021-12-02T09:48:44ZStudy the Structure Properties of SemiconductorFilm Multilayered1818-1171https://doaj.org/article/44f9c26b7c1045f5bb55801786cd5c202010-01-01T00:00:00Zhttp://www.iasj.net/iasj?func=fulltext&aId=2303https://doaj.org/toc/1818-1171In this research was study the effect of increasing the number of layers of the semiconductor films as PbS on the average grain sizes and illustrate the relationship between the increase in the average grain size and thickness of the membrane, and membrane was prepared using the easy and simple and does not need the complexity of which is that the chemical bath , and from an X-ray diffraction found that the material and the installation of a random cubic and when increasing the number of layers deposited note the emergence of a number of vertices of a substance and PbS at different levels but the level is more severe (200) as well as the value is calculated optical energy gap and found to be not affected by increase thickness and from this value can be determined the applications of semiconductor materials and elected on the basis of Article absorbed optical radiation that incident on them.Hanaa Arer Al.KaisyHind Basil Al-AtraqjiAl-Khwarizmi College of Engineering – University of BaghdadarticleChemical engineeringTP155-156Engineering (General). Civil engineering (General)TA1-2040ENAl-Khawarizmi Engineering Journal, Vol 6, Iss 2, Pp 93-99 (2010)
institution	DOAJ
collection	DOAJ
language	EN
topic	Chemical engineering TP155-156 Engineering (General). Civil engineering (General) TA1-2040
spellingShingle	Chemical engineering TP155-156 Engineering (General). Civil engineering (General) TA1-2040 Hanaa Arer Al.Kaisy Hind Basil Al-Atraqji Study the Structure Properties of SemiconductorFilm Multilayered
description	In this research was study the effect of increasing the number of layers of the semiconductor films as PbS on the average grain sizes and illustrate the relationship between the increase in the average grain size and thickness of the membrane, and membrane was prepared using the easy and simple and does not need the complexity of which is that the chemical bath , and from an X-ray diffraction found that the material and the installation of a random cubic and when increasing the number of layers deposited note the emergence of a number of vertices of a substance and PbS at different levels but the level is more severe (200) as well as the value is calculated optical energy gap and found to be not affected by increase thickness and from this value can be determined the applications of semiconductor materials and elected on the basis of Article absorbed optical radiation that incident on them.
format	article
author	Hanaa Arer Al.Kaisy Hind Basil Al-Atraqji
author_facet	Hanaa Arer Al.Kaisy Hind Basil Al-Atraqji
author_sort	Hanaa Arer Al.Kaisy
title	Study the Structure Properties of SemiconductorFilm Multilayered
title_short	Study the Structure Properties of SemiconductorFilm Multilayered
title_full	Study the Structure Properties of SemiconductorFilm Multilayered
title_fullStr	Study the Structure Properties of SemiconductorFilm Multilayered
title_full_unstemmed	Study the Structure Properties of SemiconductorFilm Multilayered
title_sort	study the structure properties of semiconductorfilm multilayered
publisher	Al-Khwarizmi College of Engineering – University of Baghdad
publishDate	2010
url	https://doaj.org/article/44f9c26b7c1045f5bb55801786cd5c20
work_keys_str_mv	AT hanaaareralkaisy studythestructurepropertiesofsemiconductorfilmmultilayered AT hindbasilalatraqji studythestructurepropertiesofsemiconductorfilmmultilayered
_version_	1718398000389160960

Study the Structure Properties of SemiconductorFilm Multilayered

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