Measuring nanoscale viscoelastic parameters of cells directly from AFM force-displacement curves
Abstract Force-displacement (F-Z) curves are the most commonly used Atomic Force Microscopy (AFM) mode to measure the local, nanoscale elastic properties of soft materials like living cells. Yet a theoretical framework has been lacking that allows the post-processing of F-Z data to extract their vis...
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Autores principales: | Yuri M. Efremov, Wen-Horng Wang, Shana D. Hardy, Robert L. Geahlen, Arvind Raman |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2017
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Materias: | |
Acceso en línea: | https://doaj.org/article/45b8218a6d8d411c94cc58c9b938bda2 |
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