Measuring nanoscale viscoelastic parameters of cells directly from AFM force-displacement curves

Abstract Force-displacement (F-Z) curves are the most commonly used Atomic Force Microscopy (AFM) mode to measure the local, nanoscale elastic properties of soft materials like living cells. Yet a theoretical framework has been lacking that allows the post-processing of F-Z data to extract their vis...

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Autores principales: Yuri M. Efremov, Wen-Horng Wang, Shana D. Hardy, Robert L. Geahlen, Arvind Raman
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/45b8218a6d8d411c94cc58c9b938bda2
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