Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode

Scanning near-field optical microscopy (SNOM) offers nanometer-scale spatial resolution, but generally does not retain tomographic information. Here, Wang et al. develop peak-force SNOM to section scattered fields and improve imaging resolution.

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Detalles Bibliográficos
Autores principales: Haomin Wang, Le Wang, Devon S. Jakob, Xiaoji G. Xu
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2018
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Acceso en línea:https://doaj.org/article/45d9c5f83773420497d9b8c58dc37a64
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Descripción
Sumario:Scanning near-field optical microscopy (SNOM) offers nanometer-scale spatial resolution, but generally does not retain tomographic information. Here, Wang et al. develop peak-force SNOM to section scattered fields and improve imaging resolution.