Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode
Scanning near-field optical microscopy (SNOM) offers nanometer-scale spatial resolution, but generally does not retain tomographic information. Here, Wang et al. develop peak-force SNOM to section scattered fields and improve imaging resolution.
Guardado en:
Autores principales: | Haomin Wang, Le Wang, Devon S. Jakob, Xiaoji G. Xu |
---|---|
Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2018
|
Materias: | |
Acceso en línea: | https://doaj.org/article/45d9c5f83773420497d9b8c58dc37a64 |
Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Ejemplares similares
-
Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling
por: Haomin Wang, et al.
Publicado: (2016) -
Deconvolution of dissipative pathways for the interpretation of tapping-mode atomic force microscopy from phase-contrast
por: Arindam Phani, et al.
Publicado: (2021) -
In situ plant materials hyperspectral imaging by multimodal scattering near-field optical microscopy
por: Anne M. Charrier, et al.
Publicado: (2021) -
Publisher Correction: In situ plant materials hyperspectral imaging by multimodal scattering near-field optical microscopy
por: Anne M. Charrier, et al.
Publicado: (2021) -
SCANNING ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHITOSAN COMPOSITE FILMS
por: CÁRDENAS,GALO, et al.
Publicado: (2010)