A Deep-Learning Approach to Detect Fiducials in Planar X-Ray Images for Undistortion of Conventional C-Arm Images
In some applications such as 2D-3D registration, undistorted images are required to achieve optimal results. These types of images can be obtained from a distortion-free C-arm (flat-panel detector) or by undistorting the images given from a conventional C-arm (analogue image intensifier.) Undistorti...
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| Autores principales: | , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
De Gruyter
2020
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/4bb757a8f10f43879e031055bfa4a21b |
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