Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients

Abstract A method to determine the doping induced charge carrier profiles in lightly and moderately doped organic semiconductor thin films is presented. The theory of the method of Charge Extraction by a Linearly Increasing Voltage technique in the doping-induced capacitive regime (doping-CELIV) is...

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Autores principales:	Mathias Nyman, Oskar J. Sandberg, Staffan Dahlström, Donato Spoltore, Christian Körner, Yadong Zhang, Stephen Barlow, Seth R. Marder, Karl Leo, Koen Vandewal, Ronald Österbacka
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/4c95e62705734f06b84b7903a40de316
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spelling	oai:doaj.org-article:4c95e62705734f06b84b7903a40de3162021-12-02T15:05:57ZDoping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients10.1038/s41598-017-05499-32045-2322https://doaj.org/article/4c95e62705734f06b84b7903a40de3162017-07-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-05499-3https://doaj.org/toc/2045-2322Abstract A method to determine the doping induced charge carrier profiles in lightly and moderately doped organic semiconductor thin films is presented. The theory of the method of Charge Extraction by a Linearly Increasing Voltage technique in the doping-induced capacitive regime (doping-CELIV) is extended to the case with non-uniform doping profiles and the analytical description is verified with drift-diffusion simulations. The method is demonstrated experimentally on evaporated organic small-molecule thin films with a controlled doping profile, and solution-processed thin films where the non-uniform doping profile is unintentional, probably induced during the deposition process, and a priori unknown. Furthermore, the method offers a possibility of directly probing charge-density distributions at interfaces between highly doped and lightly doped or undoped layers.Mathias NymanOskar J. SandbergStaffan DahlströmDonato SpoltoreChristian KörnerYadong ZhangStephen BarlowSeth R. MarderKarl LeoKoen VandewalRonald ÖsterbackaNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-9 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Mathias Nyman Oskar J. Sandberg Staffan Dahlström Donato Spoltore Christian Körner Yadong Zhang Stephen Barlow Seth R. Marder Karl Leo Koen Vandewal Ronald Österbacka Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients
description	Abstract A method to determine the doping induced charge carrier profiles in lightly and moderately doped organic semiconductor thin films is presented. The theory of the method of Charge Extraction by a Linearly Increasing Voltage technique in the doping-induced capacitive regime (doping-CELIV) is extended to the case with non-uniform doping profiles and the analytical description is verified with drift-diffusion simulations. The method is demonstrated experimentally on evaporated organic small-molecule thin films with a controlled doping profile, and solution-processed thin films where the non-uniform doping profile is unintentional, probably induced during the deposition process, and a priori unknown. Furthermore, the method offers a possibility of directly probing charge-density distributions at interfaces between highly doped and lightly doped or undoped layers.
format	article
author	Mathias Nyman Oskar J. Sandberg Staffan Dahlström Donato Spoltore Christian Körner Yadong Zhang Stephen Barlow Seth R. Marder Karl Leo Koen Vandewal Ronald Österbacka
author_facet	Mathias Nyman Oskar J. Sandberg Staffan Dahlström Donato Spoltore Christian Körner Yadong Zhang Stephen Barlow Seth R. Marder Karl Leo Koen Vandewal Ronald Österbacka
author_sort	Mathias Nyman
title	Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients
title_short	Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients
title_full	Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients
title_fullStr	Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients
title_full_unstemmed	Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients
title_sort	doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/4c95e62705734f06b84b7903a40de316
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Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients

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