LID and LETID evolution of PV modules during outdoor operation and indoor tests

Light Induced Degradation (LID) and Light and Elevated Temperature Induced Degradation (LETID) manifest with carrier injection due to light or forward bias and can lead to performance losses during the first months or years of operation in the field. We are investigating the effects of common LETID...

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Autores principales:	Fokuhl Esther, Philipp Daniel, Mülhöfer Georg, Gebhardt Paul
Formato:	article
Lenguaje:	EN
Publicado:	EDP Sciences 2021
Materias:	bo lid letid perc pv modules Renewable energy sources TJ807-830
Acceso en línea:	https://doaj.org/article/4ca00d6371e04e7f80e7b9e216b486c7
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spelling	oai:doaj.org-article:4ca00d6371e04e7f80e7b9e216b486c72021-12-02T17:13:18ZLID and LETID evolution of PV modules during outdoor operation and indoor tests2105-071610.1051/epjpv/2021009https://doaj.org/article/4ca00d6371e04e7f80e7b9e216b486c72021-01-01T00:00:00Zhttps://www.epj-pv.org/articles/epjpv/full_html/2021/01/pv210037/pv210037.htmlhttps://doaj.org/toc/2105-0716Light Induced Degradation (LID) and Light and Elevated Temperature Induced Degradation (LETID) manifest with carrier injection due to light or forward bias and can lead to performance losses during the first months or years of operation in the field. We are investigating the effects of common LETID indoor test conditions and the module temperature under outdoor exposure on the evolution of BO LID and LETID over time. The investigations are based on experimental data from twelve structurally identical mono-crystalline and two multi-crystalline PERC PV modules, which underwent a detailed experiment including five different indoor test sequences and an outdoor test. Changes in the module performance are discussed based on the current knowledge on state transitions of the BO defect and LETID. Temporary recovery of the LETID defect was used to distinguish LETID from other degradation mechanisms. Our results confirm the importance of BO stabilization prior to LETID tests as it is included in the current IEC TS draft for LETID detection. We also show that too strong acceleration of the processes can lead to misinterpretation of LETID test results. Under dark storage conditions, destabilization of BO defects was found to already evolve at temperatures as low as 75 °C and a likely alteration of subsequent LETID was observed. The performance changes under outdoor exposure can be explained with the same mechanisms as investigated under indoor experiments and reveal reversible seasonal recovery effects. Furthermore, the influence of different module operating temperatures on the evolution of both, BO LID and LETID is presented and evaluated.Fokuhl EstherPhilipp DanielMülhöfer GeorgGebhardt PaulEDP Sciencesarticlebo lidletidpercpv modulesRenewable energy sourcesTJ807-830ENEPJ Photovoltaics, Vol 12, p 9 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	bo lid letid perc pv modules Renewable energy sources TJ807-830
spellingShingle	bo lid letid perc pv modules Renewable energy sources TJ807-830 Fokuhl Esther Philipp Daniel Mülhöfer Georg Gebhardt Paul LID and LETID evolution of PV modules during outdoor operation and indoor tests
description	Light Induced Degradation (LID) and Light and Elevated Temperature Induced Degradation (LETID) manifest with carrier injection due to light or forward bias and can lead to performance losses during the first months or years of operation in the field. We are investigating the effects of common LETID indoor test conditions and the module temperature under outdoor exposure on the evolution of BO LID and LETID over time. The investigations are based on experimental data from twelve structurally identical mono-crystalline and two multi-crystalline PERC PV modules, which underwent a detailed experiment including five different indoor test sequences and an outdoor test. Changes in the module performance are discussed based on the current knowledge on state transitions of the BO defect and LETID. Temporary recovery of the LETID defect was used to distinguish LETID from other degradation mechanisms. Our results confirm the importance of BO stabilization prior to LETID tests as it is included in the current IEC TS draft for LETID detection. We also show that too strong acceleration of the processes can lead to misinterpretation of LETID test results. Under dark storage conditions, destabilization of BO defects was found to already evolve at temperatures as low as 75 °C and a likely alteration of subsequent LETID was observed. The performance changes under outdoor exposure can be explained with the same mechanisms as investigated under indoor experiments and reveal reversible seasonal recovery effects. Furthermore, the influence of different module operating temperatures on the evolution of both, BO LID and LETID is presented and evaluated.
format	article
author	Fokuhl Esther Philipp Daniel Mülhöfer Georg Gebhardt Paul
author_facet	Fokuhl Esther Philipp Daniel Mülhöfer Georg Gebhardt Paul
author_sort	Fokuhl Esther
title	LID and LETID evolution of PV modules during outdoor operation and indoor tests
title_short	LID and LETID evolution of PV modules during outdoor operation and indoor tests
title_full	LID and LETID evolution of PV modules during outdoor operation and indoor tests
title_fullStr	LID and LETID evolution of PV modules during outdoor operation and indoor tests
title_full_unstemmed	LID and LETID evolution of PV modules during outdoor operation and indoor tests
title_sort	lid and letid evolution of pv modules during outdoor operation and indoor tests
publisher	EDP Sciences
publishDate	2021
url	https://doaj.org/article/4ca00d6371e04e7f80e7b9e216b486c7
work_keys_str_mv	AT fokuhlesther lidandletidevolutionofpvmodulesduringoutdooroperationandindoortests AT philippdaniel lidandletidevolutionofpvmodulesduringoutdooroperationandindoortests AT mulhofergeorg lidandletidevolutionofpvmodulesduringoutdooroperationandindoortests AT gebhardtpaul lidandletidevolutionofpvmodulesduringoutdooroperationandindoortests
_version_	1718381316942069760

LID and LETID evolution of PV modules during outdoor operation and indoor tests

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