Application of DBN and GWO-SVM in analog circuit fault diagnosis

Abstract For large-scale integrated electronic equipment, the complex operating mechanisms make fault detection very difficult. Therefore, it is important to accurately identify analog circuit faults in a timely manner. To overcome this problem, this paper proposes a novel fault diagnosis method bas...

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Autores principales: Xiyuan Su, Changqing Cao, Xiaodong Zeng, Zhejun Feng, Jingshi Shen, Xu Yan, Zengyan Wu
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/4e79eb9c81fb4c2db031d314a3bc1c38
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