Quenching Statistics of Silicon Single Photon Avalanche Diodes

The statistical behavior of silicon-based single-photon-avalanche-diodes (SPADs) is investigated by using self-consistent 3-D Monte Carlo simulations. The coupling of Poisson and Boltzmann transport equations allows us to go beyond the analysis of avalanche breakdown and its timing and to extend the...

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Autores principales: Thibauld Cazimajou, Marco Pala, Jerome Saint-Martin, Remi Helleboid, Jeremy Grebot, Denis Rideau, Philippe Dollfus
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Publicado: IEEE 2021
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Acceso en línea:https://doaj.org/article/4f43bde47a5d4c2a88d31a2dd2793d90
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spelling oai:doaj.org-article:4f43bde47a5d4c2a88d31a2dd2793d902021-12-01T00:00:22ZQuenching Statistics of Silicon Single Photon Avalanche Diodes2168-673410.1109/JEDS.2021.3127013https://doaj.org/article/4f43bde47a5d4c2a88d31a2dd2793d902021-01-01T00:00:00Zhttps://ieeexplore.ieee.org/document/9610136/https://doaj.org/toc/2168-6734The statistical behavior of silicon-based single-photon-avalanche-diodes (SPADs) is investigated by using self-consistent 3-D Monte Carlo simulations. The coupling of Poisson and Boltzmann transport equations allows us to go beyond the analysis of avalanche breakdown and its timing and to extend the investigation to the quenching of the photodetector circuit. We find out that the quenching of SPADs is probabilistic and strongly depends on the surrounding circuit, in particular on the so-called quenching resistance. Independently of the SPAD deadtime, it appears that the extinction time needed to suppress any avalanche event may vary over a very large range.Thibauld CazimajouMarco PalaJerome Saint-MartinRemi HelleboidJeremy GrebotDenis RideauPhilippe DollfusIEEEarticleAvalanche breakdownMonte Carlo methodsavalanche photodiodesElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIEEE Journal of the Electron Devices Society, Vol 9, Pp 1098-1102 (2021)
institution DOAJ
collection DOAJ
language EN
topic Avalanche breakdown
Monte Carlo methods
avalanche photodiodes
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
spellingShingle Avalanche breakdown
Monte Carlo methods
avalanche photodiodes
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Thibauld Cazimajou
Marco Pala
Jerome Saint-Martin
Remi Helleboid
Jeremy Grebot
Denis Rideau
Philippe Dollfus
Quenching Statistics of Silicon Single Photon Avalanche Diodes
description The statistical behavior of silicon-based single-photon-avalanche-diodes (SPADs) is investigated by using self-consistent 3-D Monte Carlo simulations. The coupling of Poisson and Boltzmann transport equations allows us to go beyond the analysis of avalanche breakdown and its timing and to extend the investigation to the quenching of the photodetector circuit. We find out that the quenching of SPADs is probabilistic and strongly depends on the surrounding circuit, in particular on the so-called quenching resistance. Independently of the SPAD deadtime, it appears that the extinction time needed to suppress any avalanche event may vary over a very large range.
format article
author Thibauld Cazimajou
Marco Pala
Jerome Saint-Martin
Remi Helleboid
Jeremy Grebot
Denis Rideau
Philippe Dollfus
author_facet Thibauld Cazimajou
Marco Pala
Jerome Saint-Martin
Remi Helleboid
Jeremy Grebot
Denis Rideau
Philippe Dollfus
author_sort Thibauld Cazimajou
title Quenching Statistics of Silicon Single Photon Avalanche Diodes
title_short Quenching Statistics of Silicon Single Photon Avalanche Diodes
title_full Quenching Statistics of Silicon Single Photon Avalanche Diodes
title_fullStr Quenching Statistics of Silicon Single Photon Avalanche Diodes
title_full_unstemmed Quenching Statistics of Silicon Single Photon Avalanche Diodes
title_sort quenching statistics of silicon single photon avalanche diodes
publisher IEEE
publishDate 2021
url https://doaj.org/article/4f43bde47a5d4c2a88d31a2dd2793d90
work_keys_str_mv AT thibauldcazimajou quenchingstatisticsofsiliconsinglephotonavalanchediodes
AT marcopala quenchingstatisticsofsiliconsinglephotonavalanchediodes
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AT remihelleboid quenchingstatisticsofsiliconsinglephotonavalanchediodes
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AT denisrideau quenchingstatisticsofsiliconsinglephotonavalanchediodes
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