Equivalent Circuit Establishments of a GaN High-Electron-Mobility Transistor and 635 nm Laser Diode for a Short-Pulsed Rising Current Simulation

In this paper, a dynamic operational linear regulator (DOLR) based on a GaN high-electron-mobility transistor (HEMT) and wide-bandwidth operational amplifier was developed and implemented. The driving current could be regulated and controlled by the DOLR for 632 nm laser diodes. The constant-current...

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Autores principales: Kai-Jun Pai, Chang-Hua Lin
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
Materias:
GaN
Acceso en línea:https://doaj.org/article/4f720c0b247e4515a5faf4d36b2a74eb
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spelling oai:doaj.org-article:4f720c0b247e4515a5faf4d36b2a74eb2021-11-25T18:51:06ZEquivalent Circuit Establishments of a GaN High-Electron-Mobility Transistor and 635 nm Laser Diode for a Short-Pulsed Rising Current Simulation10.3390/pr91119752227-9717https://doaj.org/article/4f720c0b247e4515a5faf4d36b2a74eb2021-11-01T00:00:00Zhttps://www.mdpi.com/2227-9717/9/11/1975https://doaj.org/toc/2227-9717In this paper, a dynamic operational linear regulator (DOLR) based on a GaN high-electron-mobility transistor (HEMT) and wide-bandwidth operational amplifier was developed and implemented. The driving current could be regulated and controlled by the DOLR for 632 nm laser diodes. The constant-current mode for the continuous-wave laser and the pulse-width modulation (PWM) mode for the short-pulsed laser were realizable using this DOLR. This study focused on the rising-edge time change on the laser driving current when the DOLR was operated under the high-frequency PWM mode, because the parasitic components on the GaN HEMT, laser diodes, printed circuit board, and power wires could influence the current’s dynamic behavior. Therefore, the equivalent circuit models of the laser diode and GaN HEMT were applied to establish a DOLR simulation circuit in order to observe the rising-edge time change on the laser driving current. A DOLR prototype was achieved, and so experimental waveform measurements could be implemented to verify the DOLR simulation and operation.Kai-Jun PaiChang-Hua LinMDPI AGarticlelinear regulatorGaNlaser diodecontinuous-wave lasershort-pulsed laserChemical technologyTP1-1185ChemistryQD1-999ENProcesses, Vol 9, Iss 1975, p 1975 (2021)
institution DOAJ
collection DOAJ
language EN
topic linear regulator
GaN
laser diode
continuous-wave laser
short-pulsed laser
Chemical technology
TP1-1185
Chemistry
QD1-999
spellingShingle linear regulator
GaN
laser diode
continuous-wave laser
short-pulsed laser
Chemical technology
TP1-1185
Chemistry
QD1-999
Kai-Jun Pai
Chang-Hua Lin
Equivalent Circuit Establishments of a GaN High-Electron-Mobility Transistor and 635 nm Laser Diode for a Short-Pulsed Rising Current Simulation
description In this paper, a dynamic operational linear regulator (DOLR) based on a GaN high-electron-mobility transistor (HEMT) and wide-bandwidth operational amplifier was developed and implemented. The driving current could be regulated and controlled by the DOLR for 632 nm laser diodes. The constant-current mode for the continuous-wave laser and the pulse-width modulation (PWM) mode for the short-pulsed laser were realizable using this DOLR. This study focused on the rising-edge time change on the laser driving current when the DOLR was operated under the high-frequency PWM mode, because the parasitic components on the GaN HEMT, laser diodes, printed circuit board, and power wires could influence the current’s dynamic behavior. Therefore, the equivalent circuit models of the laser diode and GaN HEMT were applied to establish a DOLR simulation circuit in order to observe the rising-edge time change on the laser driving current. A DOLR prototype was achieved, and so experimental waveform measurements could be implemented to verify the DOLR simulation and operation.
format article
author Kai-Jun Pai
Chang-Hua Lin
author_facet Kai-Jun Pai
Chang-Hua Lin
author_sort Kai-Jun Pai
title Equivalent Circuit Establishments of a GaN High-Electron-Mobility Transistor and 635 nm Laser Diode for a Short-Pulsed Rising Current Simulation
title_short Equivalent Circuit Establishments of a GaN High-Electron-Mobility Transistor and 635 nm Laser Diode for a Short-Pulsed Rising Current Simulation
title_full Equivalent Circuit Establishments of a GaN High-Electron-Mobility Transistor and 635 nm Laser Diode for a Short-Pulsed Rising Current Simulation
title_fullStr Equivalent Circuit Establishments of a GaN High-Electron-Mobility Transistor and 635 nm Laser Diode for a Short-Pulsed Rising Current Simulation
title_full_unstemmed Equivalent Circuit Establishments of a GaN High-Electron-Mobility Transistor and 635 nm Laser Diode for a Short-Pulsed Rising Current Simulation
title_sort equivalent circuit establishments of a gan high-electron-mobility transistor and 635 nm laser diode for a short-pulsed rising current simulation
publisher MDPI AG
publishDate 2021
url https://doaj.org/article/4f720c0b247e4515a5faf4d36b2a74eb
work_keys_str_mv AT kaijunpai equivalentcircuitestablishmentsofaganhighelectronmobilitytransistorand635nmlaserdiodeforashortpulsedrisingcurrentsimulation
AT changhualin equivalentcircuitestablishmentsofaganhighelectronmobilitytransistorand635nmlaserdiodeforashortpulsedrisingcurrentsimulation
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