Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals

Abstract We measure the laser-induced damage threshold (LIDT) fluence under single shot at the surface of Sapphire samples prepared following the standards of two methods yielding to different surface finish and used in optical and laser industry. We use AFM microscopy to measure the roughness param...

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Autores principales: Benoît Bussière, Nicolas Sanner, Marc Sentis, Olivier Utéza
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Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/51352cd62433458f873923ed887abcf8
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spelling oai:doaj.org-article:51352cd62433458f873923ed887abcf82021-12-02T12:32:46ZImportance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals10.1038/s41598-017-01192-72045-2322https://doaj.org/article/51352cd62433458f873923ed887abcf82017-04-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-01192-7https://doaj.org/toc/2045-2322Abstract We measure the laser-induced damage threshold (LIDT) fluence under single shot at the surface of Sapphire samples prepared following the standards of two methods yielding to different surface finish and used in optical and laser industry. We use AFM microscopy to measure the roughness parameter Ra and power spectral density (PSD) of the sample surface. We show that the quality of surface topography resulting from surface preparation affects the damage threshold of Sapphire crystals exposed to femtosecond, picosecond, and nanosecond laser conditions at visible and near-infrared wavelengths. We observe a higher resistance to laser damage or macroscopic modification when the surface finish presents a smooth and regular topography. We indeed measure a 1.4 to 2 times increase of the LIDT fluence in femtosecond and picosecond regimes and up to 5 times with nanosecond pulses. Using simple damage model and PSD data, we correlate the LIDT reduction of Sapphire samples of lower quality of surface finish with the high-frequency tail component of their PSD distribution corresponding to striations of the width of a fraction of the laser wavelength. This study emphasizes the importance of detailed assessment of surface topography for laser damage evaluation and understanding and for indicating directions of improvement.Benoît BussièreNicolas SannerMarc SentisOlivier UtézaNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-10 (2017)
institution DOAJ
collection DOAJ
language EN
topic Medicine
R
Science
Q
spellingShingle Medicine
R
Science
Q
Benoît Bussière
Nicolas Sanner
Marc Sentis
Olivier Utéza
Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals
description Abstract We measure the laser-induced damage threshold (LIDT) fluence under single shot at the surface of Sapphire samples prepared following the standards of two methods yielding to different surface finish and used in optical and laser industry. We use AFM microscopy to measure the roughness parameter Ra and power spectral density (PSD) of the sample surface. We show that the quality of surface topography resulting from surface preparation affects the damage threshold of Sapphire crystals exposed to femtosecond, picosecond, and nanosecond laser conditions at visible and near-infrared wavelengths. We observe a higher resistance to laser damage or macroscopic modification when the surface finish presents a smooth and regular topography. We indeed measure a 1.4 to 2 times increase of the LIDT fluence in femtosecond and picosecond regimes and up to 5 times with nanosecond pulses. Using simple damage model and PSD data, we correlate the LIDT reduction of Sapphire samples of lower quality of surface finish with the high-frequency tail component of their PSD distribution corresponding to striations of the width of a fraction of the laser wavelength. This study emphasizes the importance of detailed assessment of surface topography for laser damage evaluation and understanding and for indicating directions of improvement.
format article
author Benoît Bussière
Nicolas Sanner
Marc Sentis
Olivier Utéza
author_facet Benoît Bussière
Nicolas Sanner
Marc Sentis
Olivier Utéza
author_sort Benoît Bussière
title Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals
title_short Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals
title_full Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals
title_fullStr Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals
title_full_unstemmed Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals
title_sort importance of surface topography on pulsed laser-induced damage threshold of sapphire crystals
publisher Nature Portfolio
publishDate 2017
url https://doaj.org/article/51352cd62433458f873923ed887abcf8
work_keys_str_mv AT benoitbussiere importanceofsurfacetopographyonpulsedlaserinduceddamagethresholdofsapphirecrystals
AT nicolassanner importanceofsurfacetopographyonpulsedlaserinduceddamagethresholdofsapphirecrystals
AT marcsentis importanceofsurfacetopographyonpulsedlaserinduceddamagethresholdofsapphirecrystals
AT olivieruteza importanceofsurfacetopographyonpulsedlaserinduceddamagethresholdofsapphirecrystals
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