Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals

Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals

Abstract We measure the laser-induced damage threshold (LIDT) fluence under single shot at the surface of Sapphire samples prepared following the standards of two methods yielding to different surface finish and used in optical and laser industry. We use AFM microscopy to measure the roughness param...

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Autores principales: Benoît Bussière, Nicolas Sanner, Marc Sentis, Olivier Utéza
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
Materias:
Medicine
R
Science
Q
Acceso en línea:https://doaj.org/article/51352cd62433458f873923ed887abcf8
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