Thermal expansion coefficient of few-layer MoS2 studied by temperature-dependent Raman spectroscopy

Abstract The thermal expansion coefficient is an important thermal parameter that influences the performance of nanodevices based on two-dimensional materials. To obtain the thermal expansion coefficient of few-layer MoS2, suspended MoS2 and supported MoS2 were systematically investigated using Rama...

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Autores principales: Zhongtao Lin, Wuguo Liu, Shibing Tian, Ke Zhu, Yuan Huang, Yang Yang
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Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/51602a48f1b6495ab84e5e779cd750a2
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spelling oai:doaj.org-article:51602a48f1b6495ab84e5e779cd750a22021-12-02T18:18:06ZThermal expansion coefficient of few-layer MoS2 studied by temperature-dependent Raman spectroscopy10.1038/s41598-021-86479-62045-2322https://doaj.org/article/51602a48f1b6495ab84e5e779cd750a22021-03-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-86479-6https://doaj.org/toc/2045-2322Abstract The thermal expansion coefficient is an important thermal parameter that influences the performance of nanodevices based on two-dimensional materials. To obtain the thermal expansion coefficient of few-layer MoS2, suspended MoS2 and supported MoS2 were systematically investigated using Raman spectroscopy in the temperature range from 77 to 557 K. The temperature-dependent evolution of the Raman frequency shift for suspended MoS2 exhibited prominent differences from that for supported MoS2, obviously demonstrating the effect due to the thermal expansion coefficient mismatch between MoS2 and the substrate. The intrinsic thermal expansion coefficients of MoS2 with different numbers of layers were calculated. Interestingly, negative thermal expansion coefficients were obtained below 175 K, which was attributed to the bending vibrations in the MoS2 layer during cooling. Our results demonstrate that Raman spectroscopy is a feasible tool for investigating the thermal properties of few-layer MoS2 and will provide useful information for its further application in photoelectronic devices.Zhongtao LinWuguo LiuShibing TianKe ZhuYuan HuangYang YangNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-9 (2021)
institution DOAJ
collection DOAJ
language EN
topic Medicine
R
Science
Q
spellingShingle Medicine
R
Science
Q
Zhongtao Lin
Wuguo Liu
Shibing Tian
Ke Zhu
Yuan Huang
Yang Yang
Thermal expansion coefficient of few-layer MoS2 studied by temperature-dependent Raman spectroscopy
description Abstract The thermal expansion coefficient is an important thermal parameter that influences the performance of nanodevices based on two-dimensional materials. To obtain the thermal expansion coefficient of few-layer MoS2, suspended MoS2 and supported MoS2 were systematically investigated using Raman spectroscopy in the temperature range from 77 to 557 K. The temperature-dependent evolution of the Raman frequency shift for suspended MoS2 exhibited prominent differences from that for supported MoS2, obviously demonstrating the effect due to the thermal expansion coefficient mismatch between MoS2 and the substrate. The intrinsic thermal expansion coefficients of MoS2 with different numbers of layers were calculated. Interestingly, negative thermal expansion coefficients were obtained below 175 K, which was attributed to the bending vibrations in the MoS2 layer during cooling. Our results demonstrate that Raman spectroscopy is a feasible tool for investigating the thermal properties of few-layer MoS2 and will provide useful information for its further application in photoelectronic devices.
format article
author Zhongtao Lin
Wuguo Liu
Shibing Tian
Ke Zhu
Yuan Huang
Yang Yang
author_facet Zhongtao Lin
Wuguo Liu
Shibing Tian
Ke Zhu
Yuan Huang
Yang Yang
author_sort Zhongtao Lin
title Thermal expansion coefficient of few-layer MoS2 studied by temperature-dependent Raman spectroscopy
title_short Thermal expansion coefficient of few-layer MoS2 studied by temperature-dependent Raman spectroscopy
title_full Thermal expansion coefficient of few-layer MoS2 studied by temperature-dependent Raman spectroscopy
title_fullStr Thermal expansion coefficient of few-layer MoS2 studied by temperature-dependent Raman spectroscopy
title_full_unstemmed Thermal expansion coefficient of few-layer MoS2 studied by temperature-dependent Raman spectroscopy
title_sort thermal expansion coefficient of few-layer mos2 studied by temperature-dependent raman spectroscopy
publisher Nature Portfolio
publishDate 2021
url https://doaj.org/article/51602a48f1b6495ab84e5e779cd750a2
work_keys_str_mv AT zhongtaolin thermalexpansioncoefficientoffewlayermos2studiedbytemperaturedependentramanspectroscopy
AT wuguoliu thermalexpansioncoefficientoffewlayermos2studiedbytemperaturedependentramanspectroscopy
AT shibingtian thermalexpansioncoefficientoffewlayermos2studiedbytemperaturedependentramanspectroscopy
AT kezhu thermalexpansioncoefficientoffewlayermos2studiedbytemperaturedependentramanspectroscopy
AT yuanhuang thermalexpansioncoefficientoffewlayermos2studiedbytemperaturedependentramanspectroscopy
AT yangyang thermalexpansioncoefficientoffewlayermos2studiedbytemperaturedependentramanspectroscopy
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