Temperature mapping of operating nanoscale devices by scanning probe thermometry

Thermometry using scanning probe techniques allows for the thermal imaging and characterization of devices with nanoscale resolution, however can be hindered by contact-related artefacts. Here, the authors demonstrate a thermal scanning probe approach which eliminates contact-resistance effects.

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Autores principales:	Fabian Menges, Philipp Mensch, Heinz Schmid, Heike Riel, Andreas Stemmer, Bernd Gotsmann
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2016
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/518ba9bc0cea4211a1291593b4e4de9e
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spelling	oai:doaj.org-article:518ba9bc0cea4211a1291593b4e4de9e2021-12-02T14:39:13ZTemperature mapping of operating nanoscale devices by scanning probe thermometry10.1038/ncomms108742041-1723https://doaj.org/article/518ba9bc0cea4211a1291593b4e4de9e2016-03-01T00:00:00Zhttps://doi.org/10.1038/ncomms10874https://doaj.org/toc/2041-1723Thermometry using scanning probe techniques allows for the thermal imaging and characterization of devices with nanoscale resolution, however can be hindered by contact-related artefacts. Here, the authors demonstrate a thermal scanning probe approach which eliminates contact-resistance effects.Fabian MengesPhilipp MenschHeinz SchmidHeike RielAndreas StemmerBernd GotsmannNature PortfolioarticleScienceQENNature Communications, Vol 7, Iss 1, Pp 1-6 (2016)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Fabian Menges Philipp Mensch Heinz Schmid Heike Riel Andreas Stemmer Bernd Gotsmann Temperature mapping of operating nanoscale devices by scanning probe thermometry
description	Thermometry using scanning probe techniques allows for the thermal imaging and characterization of devices with nanoscale resolution, however can be hindered by contact-related artefacts. Here, the authors demonstrate a thermal scanning probe approach which eliminates contact-resistance effects.
format	article
author	Fabian Menges Philipp Mensch Heinz Schmid Heike Riel Andreas Stemmer Bernd Gotsmann
author_facet	Fabian Menges Philipp Mensch Heinz Schmid Heike Riel Andreas Stemmer Bernd Gotsmann
author_sort	Fabian Menges
title	Temperature mapping of operating nanoscale devices by scanning probe thermometry
title_short	Temperature mapping of operating nanoscale devices by scanning probe thermometry
title_full	Temperature mapping of operating nanoscale devices by scanning probe thermometry
title_fullStr	Temperature mapping of operating nanoscale devices by scanning probe thermometry
title_full_unstemmed	Temperature mapping of operating nanoscale devices by scanning probe thermometry
title_sort	temperature mapping of operating nanoscale devices by scanning probe thermometry
publisher	Nature Portfolio
publishDate	2016
url	https://doaj.org/article/518ba9bc0cea4211a1291593b4e4de9e
work_keys_str_mv	AT fabianmenges temperaturemappingofoperatingnanoscaledevicesbyscanningprobethermometry AT philippmensch temperaturemappingofoperatingnanoscaledevicesbyscanningprobethermometry AT heinzschmid temperaturemappingofoperatingnanoscaledevicesbyscanningprobethermometry AT heikeriel temperaturemappingofoperatingnanoscaledevicesbyscanningprobethermometry AT andreasstemmer temperaturemappingofoperatingnanoscaledevicesbyscanningprobethermometry AT berndgotsmann temperaturemappingofoperatingnanoscaledevicesbyscanningprobethermometry
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Temperature mapping of operating nanoscale devices by scanning probe thermometry

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