Error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system

Quantum error mitigation promises to improve expectation values’ estimation without the resource overhead of quantum error correction. Here, the authors test probabilistic error cancellation using trapped ions, decreasing single- and two-qubit gates’ error rates by two and one order of magnitude res...

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Autores principales:	Shuaining Zhang, Yao Lu, Kuan Zhang, Wentao Chen, Ying Li, Jing-Ning Zhang, Kihwan Kim
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2020
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/51bece93eb734c83a567432141ca9bf2
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spelling	oai:doaj.org-article:51bece93eb734c83a567432141ca9bf22021-12-02T14:41:03ZError-mitigated quantum gates exceeding physical fidelities in a trapped-ion system10.1038/s41467-020-14376-z2041-1723https://doaj.org/article/51bece93eb734c83a567432141ca9bf22020-01-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-14376-zhttps://doaj.org/toc/2041-1723Quantum error mitigation promises to improve expectation values’ estimation without the resource overhead of quantum error correction. Here, the authors test probabilistic error cancellation using trapped ions, decreasing single- and two-qubit gates’ error rates by two and one order of magnitude respectively.Shuaining ZhangYao LuKuan ZhangWentao ChenYing LiJing-Ning ZhangKihwan KimNature PortfolioarticleScienceQENNature Communications, Vol 11, Iss 1, Pp 1-8 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Shuaining Zhang Yao Lu Kuan Zhang Wentao Chen Ying Li Jing-Ning Zhang Kihwan Kim Error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system
description	Quantum error mitigation promises to improve expectation values’ estimation without the resource overhead of quantum error correction. Here, the authors test probabilistic error cancellation using trapped ions, decreasing single- and two-qubit gates’ error rates by two and one order of magnitude respectively.
format	article
author	Shuaining Zhang Yao Lu Kuan Zhang Wentao Chen Ying Li Jing-Ning Zhang Kihwan Kim
author_facet	Shuaining Zhang Yao Lu Kuan Zhang Wentao Chen Ying Li Jing-Ning Zhang Kihwan Kim
author_sort	Shuaining Zhang
title	Error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system
title_short	Error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system
title_full	Error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system
title_fullStr	Error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system
title_full_unstemmed	Error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system
title_sort	error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system
publisher	Nature Portfolio
publishDate	2020
url	https://doaj.org/article/51bece93eb734c83a567432141ca9bf2
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Error-mitigated quantum gates exceeding physical fidelities in a trapped-ion system

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