Effect of load sequence interaction on bond-wire lifetime due to power cycling

Abstract Experimental investigations on the effects of load sequence on degradations of bond-wire contacts of Insulated Gate Bipolar Transistors power modules are reported in this paper. Both the junction temperature swing ( $$\Delta T_{j}$$ Δ T j ) and the heating duration ( $$t_{ON}$$ t ON ) are i...

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Autores principales:	Zoubir Khatir, Son-Ha Tran, Ali Ibrahim, Richard Lallemand, Nicolas Degrenne
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2021
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/5321eb1bf0a3412dbb3da87d8718420b
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spelling	oai:doaj.org-article:5321eb1bf0a3412dbb3da87d8718420b2021-12-02T13:20:12ZEffect of load sequence interaction on bond-wire lifetime due to power cycling10.1038/s41598-021-84976-22045-2322https://doaj.org/article/5321eb1bf0a3412dbb3da87d8718420b2021-03-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-84976-2https://doaj.org/toc/2045-2322Abstract Experimental investigations on the effects of load sequence on degradations of bond-wire contacts of Insulated Gate Bipolar Transistors power modules are reported in this paper. Both the junction temperature swing ( $$\Delta T_{j}$$ Δ T j ) and the heating duration ( $$t_{ON}$$ t ON ) are investigated. First, power cycling tests with single conditions (in $$\Delta T_{j}$$ Δ T j and $$t_{ON}$$ t ON ), are performed in order to serve as test references. Then, combined power cycling tests with two-level stress conditions have been done sequentially. These tests are carried-out in the two sequences: low stress/high stress (LH) and high stress/low stress (HL) for both $$\Delta T_{j}$$ Δ T j and $$t_{ON}$$ t ON . The tests conducted show that a sequencing in $$\Delta T_{j}$$ Δ T j regardless of the direction “high-low” or “low–high” leads to an acceleration of degradations and so, to shorter lifetimes. This is more pronounced when the difference between the stress levels is large. With regard to the heating duration ( $$t_{ON}$$ t ON ), the effect seems insignificant. However, it is necessary to confirm the effect of this last parameter by additional tests.Zoubir KhatirSon-Ha TranAli IbrahimRichard LallemandNicolas DegrenneNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Zoubir Khatir Son-Ha Tran Ali Ibrahim Richard Lallemand Nicolas Degrenne Effect of load sequence interaction on bond-wire lifetime due to power cycling
description	Abstract Experimental investigations on the effects of load sequence on degradations of bond-wire contacts of Insulated Gate Bipolar Transistors power modules are reported in this paper. Both the junction temperature swing ( $$\Delta T_{j}$$ Δ T j ) and the heating duration ( $$t_{ON}$$ t ON ) are investigated. First, power cycling tests with single conditions (in $$\Delta T_{j}$$ Δ T j and $$t_{ON}$$ t ON ), are performed in order to serve as test references. Then, combined power cycling tests with two-level stress conditions have been done sequentially. These tests are carried-out in the two sequences: low stress/high stress (LH) and high stress/low stress (HL) for both $$\Delta T_{j}$$ Δ T j and $$t_{ON}$$ t ON . The tests conducted show that a sequencing in $$\Delta T_{j}$$ Δ T j regardless of the direction “high-low” or “low–high” leads to an acceleration of degradations and so, to shorter lifetimes. This is more pronounced when the difference between the stress levels is large. With regard to the heating duration ( $$t_{ON}$$ t ON ), the effect seems insignificant. However, it is necessary to confirm the effect of this last parameter by additional tests.
format	article
author	Zoubir Khatir Son-Ha Tran Ali Ibrahim Richard Lallemand Nicolas Degrenne
author_facet	Zoubir Khatir Son-Ha Tran Ali Ibrahim Richard Lallemand Nicolas Degrenne
author_sort	Zoubir Khatir
title	Effect of load sequence interaction on bond-wire lifetime due to power cycling
title_short	Effect of load sequence interaction on bond-wire lifetime due to power cycling
title_full	Effect of load sequence interaction on bond-wire lifetime due to power cycling
title_fullStr	Effect of load sequence interaction on bond-wire lifetime due to power cycling
title_full_unstemmed	Effect of load sequence interaction on bond-wire lifetime due to power cycling
title_sort	effect of load sequence interaction on bond-wire lifetime due to power cycling
publisher	Nature Portfolio
publishDate	2021
url	https://doaj.org/article/5321eb1bf0a3412dbb3da87d8718420b
work_keys_str_mv	AT zoubirkhatir effectofloadsequenceinteractiononbondwirelifetimeduetopowercycling AT sonhatran effectofloadsequenceinteractiononbondwirelifetimeduetopowercycling AT aliibrahim effectofloadsequenceinteractiononbondwirelifetimeduetopowercycling AT richardlallemand effectofloadsequenceinteractiononbondwirelifetimeduetopowercycling AT nicolasdegrenne effectofloadsequenceinteractiononbondwirelifetimeduetopowercycling
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Effect of load sequence interaction on bond-wire lifetime due to power cycling

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