Effect of load sequence interaction on bond-wire lifetime due to power cycling

Abstract Experimental investigations on the effects of load sequence on degradations of bond-wire contacts of Insulated Gate Bipolar Transistors power modules are reported in this paper. Both the junction temperature swing ( $$\Delta T_{j}$$ Δ T j ) and the heating duration ( $$t_{ON}$$ t ON ) are i...

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Autores principales: Zoubir Khatir, Son-Ha Tran, Ali Ibrahim, Richard Lallemand, Nicolas Degrenne
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/5321eb1bf0a3412dbb3da87d8718420b
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