The Study of Optical and Electrical Properties of Nanostructured Silicon Carbide Thin Films Grown by Pulsed-Laser Deposition

In this paper, nanostructured silicon carbide (SiC) thin films are deposited onto glass substrate using pulsed laser deposition technique. Electrical and optical characterizations such as conductivity, resistivity, transmission, Seeback effect, absorption, absorption coefficient, energy band gap, a...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Mohammed F. Mohammed Sabri, Muhanad A. Ahmed, Wathiq R. Abed
Formato: article
Lenguaje:EN
Publicado: Koya University 2021
Materias:
S
T
Q
Acceso en línea:https://doaj.org/article/57a2df09a8c746cab49cf13611310542
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares