M-Center in Neutron-Irradiated 4H-SiC

We report on the metastable defects introduced in the n-type 4H-SiC material by epithermal and fast neutron irradiation. The epithermal and fast neutron irradiation defects in 4H-SiC are much less explored compared to electron or proton irradiation-induced defects. In addition to the carbon vacancy...

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Autores principales: Ivana Capan, Tomislav Brodar, Takahiro Makino, Vladimir Radulovic, Luka Snoj
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Publicado: MDPI AG 2021
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spelling oai:doaj.org-article:58c3fc5d3b4f461f99a536a07e3b2f742021-11-25T17:19:27ZM-Center in Neutron-Irradiated 4H-SiC10.3390/cryst111114042073-4352https://doaj.org/article/58c3fc5d3b4f461f99a536a07e3b2f742021-11-01T00:00:00Zhttps://www.mdpi.com/2073-4352/11/11/1404https://doaj.org/toc/2073-4352We report on the metastable defects introduced in the n-type 4H-SiC material by epithermal and fast neutron irradiation. The epithermal and fast neutron irradiation defects in 4H-SiC are much less explored compared to electron or proton irradiation-induced defects. In addition to the carbon vacancy (Vc), silicon vacancy (Vsi) and carbon antisite-carbon vacancy (CAV) complex, the neutron irradiation has introduced four deep-level defects, all arising from the metastable defect, the M-center. The metastable deep-level defects were investigated by deep level transient spectroscopy (DLTS), high-resolution Laplace DLTS (L-DLTS) and isothermal DLTS. The existence of the fourth deep-level defect, M<sub>4</sub>, recently observed in ion-implanted 4H-SiC, has been additionally confirmed in neutron-irradiated samples. The isothermal DLTS technique has been proven as a useful tool for studying the metastable defects.Ivana CapanTomislav BrodarTakahiro MakinoVladimir RadulovicLuka SnojMDPI AGarticledefects4H-SiCDLTSneutronsCrystallographyQD901-999ENCrystals, Vol 11, Iss 1404, p 1404 (2021)
institution DOAJ
collection DOAJ
language EN
topic defects
4H-SiC
DLTS
neutrons
Crystallography
QD901-999
spellingShingle defects
4H-SiC
DLTS
neutrons
Crystallography
QD901-999
Ivana Capan
Tomislav Brodar
Takahiro Makino
Vladimir Radulovic
Luka Snoj
M-Center in Neutron-Irradiated 4H-SiC
description We report on the metastable defects introduced in the n-type 4H-SiC material by epithermal and fast neutron irradiation. The epithermal and fast neutron irradiation defects in 4H-SiC are much less explored compared to electron or proton irradiation-induced defects. In addition to the carbon vacancy (Vc), silicon vacancy (Vsi) and carbon antisite-carbon vacancy (CAV) complex, the neutron irradiation has introduced four deep-level defects, all arising from the metastable defect, the M-center. The metastable deep-level defects were investigated by deep level transient spectroscopy (DLTS), high-resolution Laplace DLTS (L-DLTS) and isothermal DLTS. The existence of the fourth deep-level defect, M<sub>4</sub>, recently observed in ion-implanted 4H-SiC, has been additionally confirmed in neutron-irradiated samples. The isothermal DLTS technique has been proven as a useful tool for studying the metastable defects.
format article
author Ivana Capan
Tomislav Brodar
Takahiro Makino
Vladimir Radulovic
Luka Snoj
author_facet Ivana Capan
Tomislav Brodar
Takahiro Makino
Vladimir Radulovic
Luka Snoj
author_sort Ivana Capan
title M-Center in Neutron-Irradiated 4H-SiC
title_short M-Center in Neutron-Irradiated 4H-SiC
title_full M-Center in Neutron-Irradiated 4H-SiC
title_fullStr M-Center in Neutron-Irradiated 4H-SiC
title_full_unstemmed M-Center in Neutron-Irradiated 4H-SiC
title_sort m-center in neutron-irradiated 4h-sic
publisher MDPI AG
publishDate 2021
url https://doaj.org/article/58c3fc5d3b4f461f99a536a07e3b2f74
work_keys_str_mv AT ivanacapan mcenterinneutronirradiated4hsic
AT tomislavbrodar mcenterinneutronirradiated4hsic
AT takahiromakino mcenterinneutronirradiated4hsic
AT vladimirradulovic mcenterinneutronirradiated4hsic
AT lukasnoj mcenterinneutronirradiated4hsic
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