Effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface

Intermetallic compounds (IMC) are found in the dual-layer composite, such as Si/Cu composite in multilayer semiconductor structures, and are often ignored in simulations that aim to predict the mechanical properties. The interface model of Si/Cu composites with different thickness of IMC layer is fi...

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Autores principales: Chaoyue Ji, Xintian Cai, Zhen Zhou, Fang Dong, Sheng Liu, Bing Gao
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Lenguaje:EN
Publicado: Elsevier 2021
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Acceso en línea:https://doaj.org/article/5949a4b77f3e42ae9c0c5f936d99d865
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spelling oai:doaj.org-article:5949a4b77f3e42ae9c0c5f936d99d8652021-11-28T04:27:41ZEffects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface0264-127510.1016/j.matdes.2021.110251https://doaj.org/article/5949a4b77f3e42ae9c0c5f936d99d8652021-12-01T00:00:00Zhttp://www.sciencedirect.com/science/article/pii/S0264127521008066https://doaj.org/toc/0264-1275Intermetallic compounds (IMC) are found in the dual-layer composite, such as Si/Cu composite in multilayer semiconductor structures, and are often ignored in simulations that aim to predict the mechanical properties. The interface model of Si/Cu composites with different thickness of IMC layer is first established by molecular dynamics simulation. Then this study analyzed the elastoplastic behavior and adhesion behavior of the Si/Cu interface and the effect of IMC on the fracture properties. The simulation results demonstrate that the Si/Cu interface fails in a quasi-brittle fracture mode. The crack propagates along the interface between Si and the IMC layer. An apparent dislocation emission and large plastic deformation are found exclusively in the Cu layer. The thickness of the IMC layer increased from 2 to 10 Å, and the critical strain energy release rate increased from 14.48 J/m2 to 19.76 J/m2, while the equivalent modulus is not increase monotonically. Therefore, the IMC is of high significance for predicting the mechanical properties of the dual-layer composite.Chaoyue JiXintian CaiZhen ZhouFang DongSheng LiuBing GaoElsevierarticleIntermetallic compoundMechanical propertyMolecular dynamicsSilicon-copper interfaceMaterials of engineering and construction. Mechanics of materialsTA401-492ENMaterials & Design, Vol 212, Iss , Pp 110251- (2021)
institution DOAJ
collection DOAJ
language EN
topic Intermetallic compound
Mechanical property
Molecular dynamics
Silicon-copper interface
Materials of engineering and construction. Mechanics of materials
TA401-492
spellingShingle Intermetallic compound
Mechanical property
Molecular dynamics
Silicon-copper interface
Materials of engineering and construction. Mechanics of materials
TA401-492
Chaoyue Ji
Xintian Cai
Zhen Zhou
Fang Dong
Sheng Liu
Bing Gao
Effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface
description Intermetallic compounds (IMC) are found in the dual-layer composite, such as Si/Cu composite in multilayer semiconductor structures, and are often ignored in simulations that aim to predict the mechanical properties. The interface model of Si/Cu composites with different thickness of IMC layer is first established by molecular dynamics simulation. Then this study analyzed the elastoplastic behavior and adhesion behavior of the Si/Cu interface and the effect of IMC on the fracture properties. The simulation results demonstrate that the Si/Cu interface fails in a quasi-brittle fracture mode. The crack propagates along the interface between Si and the IMC layer. An apparent dislocation emission and large plastic deformation are found exclusively in the Cu layer. The thickness of the IMC layer increased from 2 to 10 Å, and the critical strain energy release rate increased from 14.48 J/m2 to 19.76 J/m2, while the equivalent modulus is not increase monotonically. Therefore, the IMC is of high significance for predicting the mechanical properties of the dual-layer composite.
format article
author Chaoyue Ji
Xintian Cai
Zhen Zhou
Fang Dong
Sheng Liu
Bing Gao
author_facet Chaoyue Ji
Xintian Cai
Zhen Zhou
Fang Dong
Sheng Liu
Bing Gao
author_sort Chaoyue Ji
title Effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface
title_short Effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface
title_full Effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface
title_fullStr Effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface
title_full_unstemmed Effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface
title_sort effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface
publisher Elsevier
publishDate 2021
url https://doaj.org/article/5949a4b77f3e42ae9c0c5f936d99d865
work_keys_str_mv AT chaoyueji effectsofintermetalliccompoundlayerthicknessonthemechanicalpropertiesofsiliconcopperinterface
AT xintiancai effectsofintermetalliccompoundlayerthicknessonthemechanicalpropertiesofsiliconcopperinterface
AT zhenzhou effectsofintermetalliccompoundlayerthicknessonthemechanicalpropertiesofsiliconcopperinterface
AT fangdong effectsofintermetalliccompoundlayerthicknessonthemechanicalpropertiesofsiliconcopperinterface
AT shengliu effectsofintermetalliccompoundlayerthicknessonthemechanicalpropertiesofsiliconcopperinterface
AT binggao effectsofintermetalliccompoundlayerthicknessonthemechanicalpropertiesofsiliconcopperinterface
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