Distilling nanoscale heterogeneity of amorphous silicon using tip-enhanced Raman spectroscopy (TERS) via multiresolution manifold learning

Short range atomic ordering quantification and nanoscale spatial resolution over a large area for amorphous materials is crucial for accelerating technology development but remain challenges. Here, the authors explore nanoscale heterogeneity of amorphous silicon by tip-enhanced Raman spectroscopy vi...

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Autores principales: Guang Yang, Xin Li, Yongqiang Cheng, Mingchao Wang, Dong Ma, Alexei P. Sokolov, Sergei V. Kalinin, Gabriel M. Veith, Jagjit Nanda
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/5adf3a2cd5814557993a025fe15645b4
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Sumario:Short range atomic ordering quantification and nanoscale spatial resolution over a large area for amorphous materials is crucial for accelerating technology development but remain challenges. Here, the authors explore nanoscale heterogeneity of amorphous silicon by tip-enhanced Raman spectroscopy via multiresolution manifold learning.