In situ stable crack growth at the micron scale

To improve mechanical properties in ceramics through grain boundary engineering, precise mechanical characterization of individual boundaries is vital yet difficult to achieve. Here authors perform experiments using an in situ scanning electron microscopy based double cantilever beam test, allowing...

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Autores principales: Giorgio Sernicola, Tommaso Giovannini, Punit Patel, James R. Kermode, Daniel S. Balint, T. Ben Britton, Finn Giuliani
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/5b04f69db942434bb28086bc735e1c9f
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Sumario:To improve mechanical properties in ceramics through grain boundary engineering, precise mechanical characterization of individual boundaries is vital yet difficult to achieve. Here authors perform experiments using an in situ scanning electron microscopy based double cantilever beam test, allowing to directly view and measure stable crack growth in silicon carbide.