In situ stable crack growth at the micron scale

To improve mechanical properties in ceramics through grain boundary engineering, precise mechanical characterization of individual boundaries is vital yet difficult to achieve. Here authors perform experiments using an in situ scanning electron microscopy based double cantilever beam test, allowing...

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Autores principales:	Giorgio Sernicola, Tommaso Giovannini, Punit Patel, James R. Kermode, Daniel S. Balint, T. Ben Britton, Finn Giuliani
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/5b04f69db942434bb28086bc735e1c9f
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spelling	oai:doaj.org-article:5b04f69db942434bb28086bc735e1c9f2021-12-02T13:57:54ZIn situ stable crack growth at the micron scale10.1038/s41467-017-00139-w2041-1723https://doaj.org/article/5b04f69db942434bb28086bc735e1c9f2017-07-01T00:00:00Zhttps://doi.org/10.1038/s41467-017-00139-whttps://doaj.org/toc/2041-1723To improve mechanical properties in ceramics through grain boundary engineering, precise mechanical characterization of individual boundaries is vital yet difficult to achieve. Here authors perform experiments using an in situ scanning electron microscopy based double cantilever beam test, allowing to directly view and measure stable crack growth in silicon carbide.Giorgio SernicolaTommaso GiovanniniPunit PatelJames R. KermodeDaniel S. BalintT. Ben BrittonFinn GiulianiNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-9 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Giorgio Sernicola Tommaso Giovannini Punit Patel James R. Kermode Daniel S. Balint T. Ben Britton Finn Giuliani In situ stable crack growth at the micron scale
description	To improve mechanical properties in ceramics through grain boundary engineering, precise mechanical characterization of individual boundaries is vital yet difficult to achieve. Here authors perform experiments using an in situ scanning electron microscopy based double cantilever beam test, allowing to directly view and measure stable crack growth in silicon carbide.
format	article
author	Giorgio Sernicola Tommaso Giovannini Punit Patel James R. Kermode Daniel S. Balint T. Ben Britton Finn Giuliani
author_facet	Giorgio Sernicola Tommaso Giovannini Punit Patel James R. Kermode Daniel S. Balint T. Ben Britton Finn Giuliani
author_sort	Giorgio Sernicola
title	In situ stable crack growth at the micron scale
title_short	In situ stable crack growth at the micron scale
title_full	In situ stable crack growth at the micron scale
title_fullStr	In situ stable crack growth at the micron scale
title_full_unstemmed	In situ stable crack growth at the micron scale
title_sort	in situ stable crack growth at the micron scale
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/5b04f69db942434bb28086bc735e1c9f
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_version_	1718392260873158656

In situ stable crack growth at the micron scale

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