Development of high-throughput ATR-FTIR technology for rapid triage of brain cancer

Diagnosing brain cancer is frequently difficult and requires specialist equipment. Here, the authors develop their previous attenuated total reflectance-Fourier transform infrared spectroscopy method and incoporate the use of disposable silicon wafers for diagnosing brain cancer using serum samples.

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Detalles Bibliográficos
Autores principales: Holly J. Butler, Paul M. Brennan, James M. Cameron, Duncan Finlayson, Mark G. Hegarty, Michael D. Jenkinson, David S. Palmer, Benjamin R. Smith, Matthew J. Baker
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Acceso en línea:https://doaj.org/article/5b3dd95709634629b026079f78f90af9
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Descripción
Sumario:Diagnosing brain cancer is frequently difficult and requires specialist equipment. Here, the authors develop their previous attenuated total reflectance-Fourier transform infrared spectroscopy method and incoporate the use of disposable silicon wafers for diagnosing brain cancer using serum samples.