Accurate localization microscopy by intrinsic aberration calibration

The authors demonstrate accurate localization in three dimensions by comprehensive calibration of an ordinary microscope, exploiting the latent information of intrinsic aberrations. Rigid transformation of the emitter positions tests the method and enables measurements in six degrees of freedom.

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Autores principales:	Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, Samuel M. Stavis
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2021
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/5bb5b08176f84ffc82cdc3a3f4648292
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id	oai:doaj.org-article:5bb5b08176f84ffc82cdc3a3f4648292
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spelling	oai:doaj.org-article:5bb5b08176f84ffc82cdc3a3f46482922021-12-02T17:44:52ZAccurate localization microscopy by intrinsic aberration calibration10.1038/s41467-021-23419-y2041-1723https://doaj.org/article/5bb5b08176f84ffc82cdc3a3f46482922021-06-01T00:00:00Zhttps://doi.org/10.1038/s41467-021-23419-yhttps://doaj.org/toc/2041-1723The authors demonstrate accurate localization in three dimensions by comprehensive calibration of an ordinary microscope, exploiting the latent information of intrinsic aberrations. Rigid transformation of the emitter positions tests the method and enables measurements in six degrees of freedom.Craig R. CopelandCraig D. McGrayB. Robert IlicJon GeistSamuel M. StavisNature PortfolioarticleScienceQENNature Communications, Vol 12, Iss 1, Pp 1-13 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Craig R. Copeland Craig D. McGray B. Robert Ilic Jon Geist Samuel M. Stavis Accurate localization microscopy by intrinsic aberration calibration
description	The authors demonstrate accurate localization in three dimensions by comprehensive calibration of an ordinary microscope, exploiting the latent information of intrinsic aberrations. Rigid transformation of the emitter positions tests the method and enables measurements in six degrees of freedom.
format	article
author	Craig R. Copeland Craig D. McGray B. Robert Ilic Jon Geist Samuel M. Stavis
author_facet	Craig R. Copeland Craig D. McGray B. Robert Ilic Jon Geist Samuel M. Stavis
author_sort	Craig R. Copeland
title	Accurate localization microscopy by intrinsic aberration calibration
title_short	Accurate localization microscopy by intrinsic aberration calibration
title_full	Accurate localization microscopy by intrinsic aberration calibration
title_fullStr	Accurate localization microscopy by intrinsic aberration calibration
title_full_unstemmed	Accurate localization microscopy by intrinsic aberration calibration
title_sort	accurate localization microscopy by intrinsic aberration calibration
publisher	Nature Portfolio
publishDate	2021
url	https://doaj.org/article/5bb5b08176f84ffc82cdc3a3f4648292
work_keys_str_mv	AT craigrcopeland accuratelocalizationmicroscopybyintrinsicaberrationcalibration AT craigdmcgray accuratelocalizationmicroscopybyintrinsicaberrationcalibration AT brobertilic accuratelocalizationmicroscopybyintrinsicaberrationcalibration AT jongeist accuratelocalizationmicroscopybyintrinsicaberrationcalibration AT samuelmstavis accuratelocalizationmicroscopybyintrinsicaberrationcalibration
_version_	1718379646048796672

Accurate localization microscopy by intrinsic aberration calibration

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