Accurate localization microscopy by intrinsic aberration calibration

The authors demonstrate accurate localization in three dimensions by comprehensive calibration of an ordinary microscope, exploiting the latent information of intrinsic aberrations. Rigid transformation of the emitter positions tests the method and enables measurements in six degrees of freedom.

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Detalles Bibliográficos
Autores principales: Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, Samuel M. Stavis
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Q
Acceso en línea:https://doaj.org/article/5bb5b08176f84ffc82cdc3a3f4648292
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