Accurate localization microscopy by intrinsic aberration calibration
The authors demonstrate accurate localization in three dimensions by comprehensive calibration of an ordinary microscope, exploiting the latent information of intrinsic aberrations. Rigid transformation of the emitter positions tests the method and enables measurements in six degrees of freedom.
Guardado en:
Autores principales: | Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, Samuel M. Stavis |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2021
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Materias: | |
Acceso en línea: | https://doaj.org/article/5bb5b08176f84ffc82cdc3a3f4648292 |
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