Cita APA (7a ed.)

Fu, L., Yan, Z., Fu, C., & Su, D. (2021). Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits. IEEE.

Cita Chicago Style (17a ed.)

Fu, Lu, Zhaowen Yan, Changshun Fu, y Donglin Su. Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits. IEEE, 2021.

Cita MLA (8a ed.)

Fu, Lu, et al. Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits. IEEE, 2021.