Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits

A new experimental research method on the electromagnetic susceptibility of integrated circuits (ICs) is proposed in this paper. This method is a new research topic based on seeking basic laws of chip electromagnetic susceptibility, aiming at providing an effective reference for chip electromagnetic...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autores principales:	Lu Fu, Zhaowen Yan, Changshun Fu, Donglin Su
Formato:	article
Lenguaje:	EN
Publicado:	IEEE 2021
Materias:	Integrated circuit (IC) conducted susceptibility electromagnetic compatibility (EMC) electromagnetic immunity conducted susceptibility phenomena Electrical engineering. Electronics. Nuclear engineering TK1-9971
Acceso en línea:	https://doaj.org/article/5d20528de67f4cfb8bd1be59e4ff2c93
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

id	oai:doaj.org-article:5d20528de67f4cfb8bd1be59e4ff2c93
record_format	dspace
spelling	oai:doaj.org-article:5d20528de67f4cfb8bd1be59e4ff2c932021-11-18T00:07:58ZExtraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits2169-353610.1109/ACCESS.2021.3125051https://doaj.org/article/5d20528de67f4cfb8bd1be59e4ff2c932021-01-01T00:00:00Zhttps://ieeexplore.ieee.org/document/9599676/https://doaj.org/toc/2169-3536A new experimental research method on the electromagnetic susceptibility of integrated circuits (ICs) is proposed in this paper. This method is a new research topic based on seeking basic laws of chip electromagnetic susceptibility, aiming at providing an effective reference for chip electromagnetic compatibility (EMC) designers and users. Three different types of interference waveforms are used in the experimental process, in which the laws are analyzed and summarized by observing the experimental phenomena and results. The results indicate that the influence of various signal waveforms on the chip electromagnetic susceptibility presents certain regularity. The results also show that the influence of different chips on the electromagnetic susceptibility presents different characteristics under the same waveform interference. A large number of experiments have been carried out to derive the rules of chip electromagnetic susceptibility.Lu FuZhaowen YanChangshun FuDonglin SuIEEEarticleIntegrated circuit (IC)conducted susceptibilityelectromagnetic compatibility (EMC)electromagnetic immunityconducted susceptibility phenomenaElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIEEE Access, Vol 9, Pp 149125-149136 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Integrated circuit (IC) conducted susceptibility electromagnetic compatibility (EMC) electromagnetic immunity conducted susceptibility phenomena Electrical engineering. Electronics. Nuclear engineering TK1-9971
spellingShingle	Integrated circuit (IC) conducted susceptibility electromagnetic compatibility (EMC) electromagnetic immunity conducted susceptibility phenomena Electrical engineering. Electronics. Nuclear engineering TK1-9971 Lu Fu Zhaowen Yan Changshun Fu Donglin Su Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits
description	A new experimental research method on the electromagnetic susceptibility of integrated circuits (ICs) is proposed in this paper. This method is a new research topic based on seeking basic laws of chip electromagnetic susceptibility, aiming at providing an effective reference for chip electromagnetic compatibility (EMC) designers and users. Three different types of interference waveforms are used in the experimental process, in which the laws are analyzed and summarized by observing the experimental phenomena and results. The results indicate that the influence of various signal waveforms on the chip electromagnetic susceptibility presents certain regularity. The results also show that the influence of different chips on the electromagnetic susceptibility presents different characteristics under the same waveform interference. A large number of experiments have been carried out to derive the rules of chip electromagnetic susceptibility.
format	article
author	Lu Fu Zhaowen Yan Changshun Fu Donglin Su
author_facet	Lu Fu Zhaowen Yan Changshun Fu Donglin Su
author_sort	Lu Fu
title	Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits
title_short	Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits
title_full	Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits
title_fullStr	Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits
title_full_unstemmed	Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits
title_sort	extraction and analysis of conducted electromagnetic susceptibility elements of integrated circuits
publisher	IEEE
publishDate	2021
url	https://doaj.org/article/5d20528de67f4cfb8bd1be59e4ff2c93
work_keys_str_mv	AT lufu extractionandanalysisofconductedelectromagneticsusceptibilityelementsofintegratedcircuits AT zhaowenyan extractionandanalysisofconductedelectromagneticsusceptibilityelementsofintegratedcircuits AT changshunfu extractionandanalysisofconductedelectromagneticsusceptibilityelementsofintegratedcircuits AT donglinsu extractionandanalysisofconductedelectromagneticsusceptibilityelementsofintegratedcircuits
_version_	1718425227748179968

Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits

Ejemplares similares