Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits

A new experimental research method on the electromagnetic susceptibility of integrated circuits (ICs) is proposed in this paper. This method is a new research topic based on seeking basic laws of chip electromagnetic susceptibility, aiming at providing an effective reference for chip electromagnetic...

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Autores principales: Lu Fu, Zhaowen Yan, Changshun Fu, Donglin Su
Formato: article
Lenguaje:EN
Publicado: IEEE 2021
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Acceso en línea:https://doaj.org/article/5d20528de67f4cfb8bd1be59e4ff2c93
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