Preparing local strain patterns in graphene by atomic force microscope based indentation

Abstract Patterning graphene into various mesoscopic devices such as nanoribbons, quantum dots, etc. by lithographic techniques has enabled the guiding and manipulation of graphene’s Dirac-type charge carriers. Graphene, with well-defined strain patterns, holds promise of similarly rich physics whil...

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Autores principales:	Péter Nemes-Incze, Gergő Kukucska, János Koltai, Jenő Kürti, Chanyong Hwang, Levente Tapasztó, László P. Biró
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/5dc24593081e4c109c72923f9de242d3
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id	oai:doaj.org-article:5dc24593081e4c109c72923f9de242d3
record_format	dspace
spelling	oai:doaj.org-article:5dc24593081e4c109c72923f9de242d32021-12-02T15:05:25ZPreparing local strain patterns in graphene by atomic force microscope based indentation10.1038/s41598-017-03332-52045-2322https://doaj.org/article/5dc24593081e4c109c72923f9de242d32017-06-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-03332-5https://doaj.org/toc/2045-2322Abstract Patterning graphene into various mesoscopic devices such as nanoribbons, quantum dots, etc. by lithographic techniques has enabled the guiding and manipulation of graphene’s Dirac-type charge carriers. Graphene, with well-defined strain patterns, holds promise of similarly rich physics while avoiding the problems created by the hard to control edge configuration of lithographically prepared devices. To engineer the properties of graphene via mechanical deformation, versatile new techniques are needed to pattern strain profiles in a controlled manner. Here we present a process by which strain can be created in substrate supported graphene layers. Our atomic force microscope-based technique opens up new possibilities in tailoring the properties of graphene using mechanical strain.Péter Nemes-InczeGergő KukucskaJános KoltaiJenő KürtiChanyong HwangLevente TapasztóLászló P. BiróNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-7 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Péter Nemes-Incze Gergő Kukucska János Koltai Jenő Kürti Chanyong Hwang Levente Tapasztó László P. Biró Preparing local strain patterns in graphene by atomic force microscope based indentation
description	Abstract Patterning graphene into various mesoscopic devices such as nanoribbons, quantum dots, etc. by lithographic techniques has enabled the guiding and manipulation of graphene’s Dirac-type charge carriers. Graphene, with well-defined strain patterns, holds promise of similarly rich physics while avoiding the problems created by the hard to control edge configuration of lithographically prepared devices. To engineer the properties of graphene via mechanical deformation, versatile new techniques are needed to pattern strain profiles in a controlled manner. Here we present a process by which strain can be created in substrate supported graphene layers. Our atomic force microscope-based technique opens up new possibilities in tailoring the properties of graphene using mechanical strain.
format	article
author	Péter Nemes-Incze Gergő Kukucska János Koltai Jenő Kürti Chanyong Hwang Levente Tapasztó László P. Biró
author_facet	Péter Nemes-Incze Gergő Kukucska János Koltai Jenő Kürti Chanyong Hwang Levente Tapasztó László P. Biró
author_sort	Péter Nemes-Incze
title	Preparing local strain patterns in graphene by atomic force microscope based indentation
title_short	Preparing local strain patterns in graphene by atomic force microscope based indentation
title_full	Preparing local strain patterns in graphene by atomic force microscope based indentation
title_fullStr	Preparing local strain patterns in graphene by atomic force microscope based indentation
title_full_unstemmed	Preparing local strain patterns in graphene by atomic force microscope based indentation
title_sort	preparing local strain patterns in graphene by atomic force microscope based indentation
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/5dc24593081e4c109c72923f9de242d3
work_keys_str_mv	AT peternemesincze preparinglocalstrainpatternsingraphenebyatomicforcemicroscopebasedindentation AT gergokukucska preparinglocalstrainpatternsingraphenebyatomicforcemicroscopebasedindentation AT janoskoltai preparinglocalstrainpatternsingraphenebyatomicforcemicroscopebasedindentation AT jenokurti preparinglocalstrainpatternsingraphenebyatomicforcemicroscopebasedindentation AT chanyonghwang preparinglocalstrainpatternsingraphenebyatomicforcemicroscopebasedindentation AT leventetapaszto preparinglocalstrainpatternsingraphenebyatomicforcemicroscopebasedindentation AT laszlopbiro preparinglocalstrainpatternsingraphenebyatomicforcemicroscopebasedindentation
_version_	1718388832061095936

Preparing local strain patterns in graphene by atomic force microscope based indentation

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