Estimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells

For anode-supported solid oxide fuel cells (SOFCs), huge internal stress is generated in an electrolyte thin-film due to the difference of the coefficient of thermal expansion from an anode substrate. Micro-size defects are sometimes formed in the electrolyte thin-film during a manufacturing process...

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Autores principales:	Hirofumi SUMI, Hiroyuki SHIMADA, Kazuhisa SATO, Toshiyuki HASHIDA
Formato:	article
Lenguaje:	EN
Publicado:	The Japan Society of Mechanical Engineers 2016
Materias:	solid oxide fuel cell (sofc) x-ray stress measurement micro-size defect electrolyte thin-film yttria-stabilized zirconia (ysz) Mechanical engineering and machinery TJ1-1570
Acceso en línea:	https://doaj.org/article/5e8ca34764864d0a949f9c06f99acd01
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spelling	oai:doaj.org-article:5e8ca34764864d0a949f9c06f99acd012021-11-26T06:58:32ZEstimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells2187-974510.1299/mej.16-00177https://doaj.org/article/5e8ca34764864d0a949f9c06f99acd012016-08-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/mej/3/6/3_16-00177/_pdf/-char/enhttps://doaj.org/toc/2187-9745For anode-supported solid oxide fuel cells (SOFCs), huge internal stress is generated in an electrolyte thin-film due to the difference of the coefficient of thermal expansion from an anode substrate. Micro-size defects are sometimes formed in the electrolyte thin-film during a manufacturing process, when the huge internal stress is released. The defects in the electrolyte thin-film cause cross leakage of fuel and air, which deteriorate the anode-supported SOFCs rapidly. The mechanical reliability of the electrolyte thin-film is important to prevent initial failure for cells and stacks. In the present work, the internal stress was evaluated by X-ray for planar anode-supported SOFCs with and without micro-size defects in an electrolyte thin-film. A compressive stress of 501-561 MPa was observed for yttria-stabilized zirconia (YSZ) electrolyte thin-film without micro-size defects on NiO-YSZ anode substrate sintered at 1350-1400 ℃. However, the stress was 188 and 453 MPa for the electrolyte thin-films sintered at 1200 and 1300 ℃, respectively, because of insufficient sintering. Many micro-size cracks and pores were observed in the electrolyte thin-films sintered at 1200 and 1300 ℃. Furthermore, the internal stress decreased by 50-100 MPa due to stress relief for the electrolyte thin-film with micropores, which were made during the actual manufacturing process, in spite of the sintering temperature of 1350 ℃. X-ray stress measurement has a potential to be applied as a non-destructive test method for anode-supported SOFCs.Hirofumi SUMIHiroyuki SHIMADAKazuhisa SATOToshiyuki HASHIDAThe Japan Society of Mechanical Engineersarticlesolid oxide fuel cell (sofc)x-ray stress measurementmicro-size defectelectrolyte thin-filmyttria-stabilized zirconia (ysz)Mechanical engineering and machineryTJ1-1570ENMechanical Engineering Journal, Vol 3, Iss 6, Pp 16-00177-16-00177 (2016)
institution	DOAJ
collection	DOAJ
language	EN
topic	solid oxide fuel cell (sofc) x-ray stress measurement micro-size defect electrolyte thin-film yttria-stabilized zirconia (ysz) Mechanical engineering and machinery TJ1-1570
spellingShingle	solid oxide fuel cell (sofc) x-ray stress measurement micro-size defect electrolyte thin-film yttria-stabilized zirconia (ysz) Mechanical engineering and machinery TJ1-1570 Hirofumi SUMI Hiroyuki SHIMADA Kazuhisa SATO Toshiyuki HASHIDA Estimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells
description	For anode-supported solid oxide fuel cells (SOFCs), huge internal stress is generated in an electrolyte thin-film due to the difference of the coefficient of thermal expansion from an anode substrate. Micro-size defects are sometimes formed in the electrolyte thin-film during a manufacturing process, when the huge internal stress is released. The defects in the electrolyte thin-film cause cross leakage of fuel and air, which deteriorate the anode-supported SOFCs rapidly. The mechanical reliability of the electrolyte thin-film is important to prevent initial failure for cells and stacks. In the present work, the internal stress was evaluated by X-ray for planar anode-supported SOFCs with and without micro-size defects in an electrolyte thin-film. A compressive stress of 501-561 MPa was observed for yttria-stabilized zirconia (YSZ) electrolyte thin-film without micro-size defects on NiO-YSZ anode substrate sintered at 1350-1400 ℃. However, the stress was 188 and 453 MPa for the electrolyte thin-films sintered at 1200 and 1300 ℃, respectively, because of insufficient sintering. Many micro-size cracks and pores were observed in the electrolyte thin-films sintered at 1200 and 1300 ℃. Furthermore, the internal stress decreased by 50-100 MPa due to stress relief for the electrolyte thin-film with micropores, which were made during the actual manufacturing process, in spite of the sintering temperature of 1350 ℃. X-ray stress measurement has a potential to be applied as a non-destructive test method for anode-supported SOFCs.
format	article
author	Hirofumi SUMI Hiroyuki SHIMADA Kazuhisa SATO Toshiyuki HASHIDA
author_facet	Hirofumi SUMI Hiroyuki SHIMADA Kazuhisa SATO Toshiyuki HASHIDA
author_sort	Hirofumi SUMI
title	Estimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells
title_short	Estimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells
title_full	Estimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells
title_fullStr	Estimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells
title_full_unstemmed	Estimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells
title_sort	estimation of micro-size defects in electrolyte thin-film by x-ray stress measurement for anode-supported solid oxide fuel cells
publisher	The Japan Society of Mechanical Engineers
publishDate	2016
url	https://doaj.org/article/5e8ca34764864d0a949f9c06f99acd01
work_keys_str_mv	AT hirofumisumi estimationofmicrosizedefectsinelectrolytethinfilmbyxraystressmeasurementforanodesupportedsolidoxidefuelcells AT hiroyukishimada estimationofmicrosizedefectsinelectrolytethinfilmbyxraystressmeasurementforanodesupportedsolidoxidefuelcells AT kazuhisasato estimationofmicrosizedefectsinelectrolytethinfilmbyxraystressmeasurementforanodesupportedsolidoxidefuelcells AT toshiyukihashida estimationofmicrosizedefectsinelectrolytethinfilmbyxraystressmeasurementforanodesupportedsolidoxidefuelcells
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Estimation of micro-size defects in electrolyte thin-film by X-ray stress measurement for anode-supported solid oxide fuel cells

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