Gate-reflectometry dispersive readout and coherent control of a spin qubit in silicon

Gate-reflectometry is a recently demonstrated measurement technique for single spin states in silicon. It is potentially able to perform quantum non-demolition measurements and uses compact circuitry that can be scaled up to larger quantum computers. Crippa et al. successfully combine gate-reflectom...

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Auteurs principaux: A. Crippa, R. Ezzouch, A. Aprá, A. Amisse, R. Laviéville, L. Hutin, B. Bertrand, M. Vinet, M. Urdampilleta, T. Meunier, M. Sanquer, X. Jehl, R. Maurand, S. De Franceschi
Format: article
Langue:EN
Publié: Nature Portfolio 2019
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Q
Accès en ligne:https://doaj.org/article/607f10ed51bd492c8a75a80e2d34fc23
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