Gate-reflectometry dispersive readout and coherent control of a spin qubit in silicon
Gate-reflectometry is a recently demonstrated measurement technique for single spin states in silicon. It is potentially able to perform quantum non-demolition measurements and uses compact circuitry that can be scaled up to larger quantum computers. Crippa et al. successfully combine gate-reflectom...
Saved in:
Main Authors: | A. Crippa, R. Ezzouch, A. Aprá, A. Amisse, R. Laviéville, L. Hutin, B. Bertrand, M. Vinet, M. Urdampilleta, T. Meunier, M. Sanquer, X. Jehl, R. Maurand, S. De Franceschi |
---|---|
Format: | article |
Language: | EN |
Published: |
Nature Portfolio
2019
|
Subjects: | |
Online Access: | https://doaj.org/article/607f10ed51bd492c8a75a80e2d34fc23 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
A CMOS silicon spin qubit
by: R. Maurand, et al.
Published: (2016) -
Integrated silicon qubit platform with single-spin addressability, exchange control and single-shot singlet-triplet readout
by: M. A. Fogarty, et al.
Published: (2018) -
Fast High-Fidelity Quantum Nondemolition Qubit Readout via a Nonperturbative Cross-Kerr Coupling
by: R. Dassonneville, et al.
Published: (2020) -
A CNOT gate between multiphoton qubits encoded in two cavities
by: S. Rosenblum, et al.
Published: (2018) -
Optomechanical time-domain reflectometry
by: Gil Bashan, et al.
Published: (2018)