Non-conventional mechanism of ferroelectric fatigue via cation migration

Ferroelectric fatigue degrades ferroelectric properties upon polarization cycling, but its underlying chemistry is poorly understood. Here, the authors show by multimodal chemical imaging that fatigue in PbZr0.2Ti0.8O3 thin films is associated with Cu + ions migration from the electrode into the fil...

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Autores principales:	Anton V. Ievlev, Santosh KC, Rama K. Vasudevan, Yunseok Kim, Xiaoli Lu, Marin Alexe, Valentino R. Cooper, Sergei V. Kalinin, Olga S. Ovchinnikova
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2019
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/616edf4efb774d88b46515084e5599c5
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spelling	oai:doaj.org-article:616edf4efb774d88b46515084e5599c52021-12-02T16:57:42ZNon-conventional mechanism of ferroelectric fatigue via cation migration10.1038/s41467-019-11089-w2041-1723https://doaj.org/article/616edf4efb774d88b46515084e5599c52019-07-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-11089-whttps://doaj.org/toc/2041-1723Ferroelectric fatigue degrades ferroelectric properties upon polarization cycling, but its underlying chemistry is poorly understood. Here, the authors show by multimodal chemical imaging that fatigue in PbZr0.2Ti0.8O3 thin films is associated with Cu + ions migration from the electrode into the film structure.Anton V. IevlevSantosh KCRama K. VasudevanYunseok KimXiaoli LuMarin AlexeValentino R. CooperSergei V. KalininOlga S. OvchinnikovaNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-8 (2019)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Anton V. Ievlev Santosh KC Rama K. Vasudevan Yunseok Kim Xiaoli Lu Marin Alexe Valentino R. Cooper Sergei V. Kalinin Olga S. Ovchinnikova Non-conventional mechanism of ferroelectric fatigue via cation migration
description	Ferroelectric fatigue degrades ferroelectric properties upon polarization cycling, but its underlying chemistry is poorly understood. Here, the authors show by multimodal chemical imaging that fatigue in PbZr0.2Ti0.8O3 thin films is associated with Cu + ions migration from the electrode into the film structure.
format	article
author	Anton V. Ievlev Santosh KC Rama K. Vasudevan Yunseok Kim Xiaoli Lu Marin Alexe Valentino R. Cooper Sergei V. Kalinin Olga S. Ovchinnikova
author_facet	Anton V. Ievlev Santosh KC Rama K. Vasudevan Yunseok Kim Xiaoli Lu Marin Alexe Valentino R. Cooper Sergei V. Kalinin Olga S. Ovchinnikova
author_sort	Anton V. Ievlev
title	Non-conventional mechanism of ferroelectric fatigue via cation migration
title_short	Non-conventional mechanism of ferroelectric fatigue via cation migration
title_full	Non-conventional mechanism of ferroelectric fatigue via cation migration
title_fullStr	Non-conventional mechanism of ferroelectric fatigue via cation migration
title_full_unstemmed	Non-conventional mechanism of ferroelectric fatigue via cation migration
title_sort	non-conventional mechanism of ferroelectric fatigue via cation migration
publisher	Nature Portfolio
publishDate	2019
url	https://doaj.org/article/616edf4efb774d88b46515084e5599c5
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Non-conventional mechanism of ferroelectric fatigue via cation migration

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