Interactive Strength between C60 Thin Film and Si(001) and Its Influence on Nano-Scaled Tribology
The influences of interactions between C60 thin films and Si substrates were investigated using atomic force microscopy (AFM). It was found that higher friction coefficient was obtained at the C60 domains formed on the H-terminated Si(001) substrate and lower ones on the Si(001)-2×1 substr...
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| Autores principales: | , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Japanese Society of Tribologists
2008
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/635ec5ab164e4de7bb21f83e26888677 |
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