Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management

This article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal manageme...

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Autores principales:	Cheng Li, Qi Chen, Feilong Zhang, Mengfu Di, Zijin Pan, Fei Lu, Albert Wang
Formato:	article
Lenguaje:	EN
Publicado:	IEEE 2020
Materias:	Self-heating thermal sensor in-hole diode thermal mapping thermal management control circuit Electrical engineering. Electronics. Nuclear engineering TK1-9971
Acceso en línea:	https://doaj.org/article/63ecbbc27e664ef08261d3efa734b889
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spelling	oai:doaj.org-article:63ecbbc27e664ef08261d3efa734b8892021-11-11T00:00:55ZUnder-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management2168-673410.1109/JEDS.2020.3022730https://doaj.org/article/63ecbbc27e664ef08261d3efa734b8892020-01-01T00:00:00Zhttps://ieeexplore.ieee.org/document/9187944/https://doaj.org/toc/2168-6734This article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal management with spatial resolution down to single transistor level. The in-hole thermal sensors were fabricated in a CMOS process and validated in measurements. The new chip level thermal management technique was demonstrated using a prototype power amplifier (PA) IC designed in a foundry 40nm CMOS. It opens a door for self-learning based full-chip real-time intelligent thermal management for future ICs.Cheng LiQi ChenFeilong ZhangMengfu DiZijin PanFei LuAlbert WangIEEEarticleSelf-heatingthermal sensorin-hole diodethermal mappingthermal managementcontrol circuitElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIEEE Journal of the Electron Devices Society, Vol 8, Pp 1242-1248 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Self-heating thermal sensor in-hole diode thermal mapping thermal management control circuit Electrical engineering. Electronics. Nuclear engineering TK1-9971
spellingShingle	Self-heating thermal sensor in-hole diode thermal mapping thermal management control circuit Electrical engineering. Electronics. Nuclear engineering TK1-9971 Cheng Li Qi Chen Feilong Zhang Mengfu Di Zijin Pan Fei Lu Albert Wang Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management
description	This article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal management with spatial resolution down to single transistor level. The in-hole thermal sensors were fabricated in a CMOS process and validated in measurements. The new chip level thermal management technique was demonstrated using a prototype power amplifier (PA) IC designed in a foundry 40nm CMOS. It opens a door for self-learning based full-chip real-time intelligent thermal management for future ICs.
format	article
author	Cheng Li Qi Chen Feilong Zhang Mengfu Di Zijin Pan Fei Lu Albert Wang
author_facet	Cheng Li Qi Chen Feilong Zhang Mengfu Di Zijin Pan Fei Lu Albert Wang
author_sort	Cheng Li
title	Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management
title_short	Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management
title_full	Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management
title_fullStr	Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management
title_full_unstemmed	Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management
title_sort	under-fet thermal sensor enabling smart full-chip run-time thermal management
publisher	IEEE
publishDate	2020
url	https://doaj.org/article/63ecbbc27e664ef08261d3efa734b889
work_keys_str_mv	AT chengli underfetthermalsensorenablingsmartfullchipruntimethermalmanagement AT qichen underfetthermalsensorenablingsmartfullchipruntimethermalmanagement AT feilongzhang underfetthermalsensorenablingsmartfullchipruntimethermalmanagement AT mengfudi underfetthermalsensorenablingsmartfullchipruntimethermalmanagement AT zijinpan underfetthermalsensorenablingsmartfullchipruntimethermalmanagement AT feilu underfetthermalsensorenablingsmartfullchipruntimethermalmanagement AT albertwang underfetthermalsensorenablingsmartfullchipruntimethermalmanagement
_version_	1718439678686789632

Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management

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