Model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection

Yi-Chen Yeh1, Lun-Wei Chang2, Hsin-Yuan Miao3, Szu-Po Chen1, Jhu-Tzang Lue11Department of Physics and 2Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan; 3Department of Electrical Engineering, Tunghai University, Taichung, TaiwanAbstract: A homemade microwave plasm...

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Autores principales:	Yi-Chen Yeh, Lun-Wei Chang, Hsin-Yuan Miao, et al
Formato:	article
Lenguaje:	EN
Publicado:	Dove Medical Press 2010
Materias:	Medical technology R855-855.5 Chemical technology TP1-1185
Acceso en línea:	https://doaj.org/article/645a25f42b224e02a748a53435108f47
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spelling	oai:doaj.org-article:645a25f42b224e02a748a53435108f472021-12-02T05:09:22ZModel analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection1177-8903https://doaj.org/article/645a25f42b224e02a748a53435108f472010-07-01T00:00:00Zhttp://www.dovepress.com/model-analysis-of-temperature-dependence-of-abnormal-resistivity-of-a--a4884https://doaj.org/toc/1177-8903Yi-Chen Yeh1, Lun-Wei Chang2, Hsin-Yuan Miao3, Szu-Po Chen1, Jhu-Tzang Lue11Department of Physics and 2Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan; 3Department of Electrical Engineering, Tunghai University, Taichung, TaiwanAbstract: A homemade microwave plasma-enhanced chemical vapor deposition method was used to grow a multiwalled carbon nanotube between two nickel catalyst electrodes. To investigate the transport properties and electron scattering mechanism of this interconnection (of approximately fixed length and fixed diameter), we carried out a model analysis of temperature dependence of resistivity. To explain the abnormal behavior of the negative temperature coefficient of resistivity in our experimental results, we then employed theories, such as hopping conductivity theory and variable range hopping conductivity theory, to describe resistivity in the high- and low-temperature ranges, respectively. Further, the grain boundary scattering model is also provided to fit the entire measured curve of temperature dependence of resistivity.Keywords: multiwalled carbon nanotube, resistivity, hopping conductivity, temperature dependence Yi-Chen YehLun-Wei ChangHsin-Yuan Miaoet alDove Medical PressarticleMedical technologyR855-855.5Chemical technologyTP1-1185ENNanotechnology, Science and Applications, Vol 2010, Iss default, Pp 37-43 (2010)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medical technology R855-855.5 Chemical technology TP1-1185
spellingShingle	Medical technology R855-855.5 Chemical technology TP1-1185 Yi-Chen Yeh Lun-Wei Chang Hsin-Yuan Miao et al Model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection
description	Yi-Chen Yeh1, Lun-Wei Chang2, Hsin-Yuan Miao3, Szu-Po Chen1, Jhu-Tzang Lue11Department of Physics and 2Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan; 3Department of Electrical Engineering, Tunghai University, Taichung, TaiwanAbstract: A homemade microwave plasma-enhanced chemical vapor deposition method was used to grow a multiwalled carbon nanotube between two nickel catalyst electrodes. To investigate the transport properties and electron scattering mechanism of this interconnection (of approximately fixed length and fixed diameter), we carried out a model analysis of temperature dependence of resistivity. To explain the abnormal behavior of the negative temperature coefficient of resistivity in our experimental results, we then employed theories, such as hopping conductivity theory and variable range hopping conductivity theory, to describe resistivity in the high- and low-temperature ranges, respectively. Further, the grain boundary scattering model is also provided to fit the entire measured curve of temperature dependence of resistivity.Keywords: multiwalled carbon nanotube, resistivity, hopping conductivity, temperature dependence
format	article
author	Yi-Chen Yeh Lun-Wei Chang Hsin-Yuan Miao et al
author_facet	Yi-Chen Yeh Lun-Wei Chang Hsin-Yuan Miao et al
author_sort	Yi-Chen Yeh
title	Model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection
title_short	Model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection
title_full	Model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection
title_fullStr	Model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection
title_full_unstemmed	Model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection
title_sort	model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection
publisher	Dove Medical Press
publishDate	2010
url	https://doaj.org/article/645a25f42b224e02a748a53435108f47
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_version_	1718400533972123648

Model analysis of temperature dependence of abnormal resistivity of a multiwalled carbon nanotube interconnection

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