Mobility overestimation due to gated contacts in organic field-effect transistors
Charge mobility, extracted from current–voltage curves, is an important parameter for evaluating the performance of organic field-effect transistors. Bittle et al. show that charge mobility can be overestimated by one order of magnitude due to the gate bias dependence of the charge injection process...
Enregistré dans:
Auteurs principaux: | , , , , |
---|---|
Format: | article |
Langue: | EN |
Publié: |
Nature Portfolio
2016
|
Sujets: | |
Accès en ligne: | https://doaj.org/article/6467caace8024de1b053a2a0bc33e81b |
Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|