In-situ gamma irradiation testing of radiation hardened chips till 1 MGy

Ten samples of a custom tailored Mega-Gray hardened resolver/LVDT-to-digital converter, a resistive base sensor-to-digital converter and a RS485 communication application specific integrated circuit (ASIC) were combined in 1 irradiation campaign for Fusion for Energy (Barcelona, Spain). Radiation re...

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Autores principales:	Geys David, Cao Ying, Van Uffelen Marco, Casellas Laura Mont, Vermeeren Ludo, Gusarov Andrei
Formato:	article
Lenguaje:	EN
Publicado:	EDP Sciences 2021
Materias:	rad hard asic 1mgy tid in-situ measurements Physics QC1-999
Acceso en línea:	https://doaj.org/article/6894b9a6ceaf4cc7b85ec96ff60290a2
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spelling	oai:doaj.org-article:6894b9a6ceaf4cc7b85ec96ff60290a22021-12-02T17:12:45ZIn-situ gamma irradiation testing of radiation hardened chips till 1 MGy2100-014X10.1051/epjconf/202125303004https://doaj.org/article/6894b9a6ceaf4cc7b85ec96ff60290a22021-01-01T00:00:00Zhttps://www.epj-conferences.org/articles/epjconf/pdf/2021/07/epjconf_animma2021_03004.pdfhttps://doaj.org/toc/2100-014XTen samples of a custom tailored Mega-Gray hardened resolver/LVDT-to-digital converter, a resistive base sensor-to-digital converter and a RS485 communication application specific integrated circuit (ASIC) were combined in 1 irradiation campaign for Fusion for Energy (Barcelona, Spain). Radiation resistance of these ASICs, developed by Magics Instruments (Geel, Belgium) for Fusion for Energy, was assessed for a total ionizing dose (TID) above 1 MGy using the Co-60 gamma underwater irradiation test facility at SCK CEN (Mol, Belgium). The 3 different ASICs were irradiated at an average dose rate of 484 Gy/h and their performance was continuously measured (in-situ) during 97 irradiation days. A fully autonomous and modular test setup was developed to perform these measurements and ensure continuous operation by implementing a recovery and warning system in case of failure to restrict measurement data loss to minimum. An in-situ post-irradiation assessment was performed afterwards to observe recovery from the irradiation in a socalled annealing phase. Annealing was done for seven days at room temperature followed by another 7 days of high temperature annealing at 100 °C to accelerate the recovery effect. During the full test campaign all data was saved in a database, post-processed with Python into readable plots to deduct possible performance shifts due to the irradiation and afterwards during recovery. During the complete testing campaign of these ASICs the ESCC22900 (Total Dose Steady-State Irradiation Test Method) standard was followed.Geys DavidCao YingVan Uffelen MarcoCasellas Laura MontVermeeren LudoGusarov AndreiEDP Sciencesarticlerad hard asic1mgy tidin-situ measurementsPhysicsQC1-999ENEPJ Web of Conferences, Vol 253, p 03004 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	rad hard asic 1mgy tid in-situ measurements Physics QC1-999
spellingShingle	rad hard asic 1mgy tid in-situ measurements Physics QC1-999 Geys David Cao Ying Van Uffelen Marco Casellas Laura Mont Vermeeren Ludo Gusarov Andrei In-situ gamma irradiation testing of radiation hardened chips till 1 MGy
description	Ten samples of a custom tailored Mega-Gray hardened resolver/LVDT-to-digital converter, a resistive base sensor-to-digital converter and a RS485 communication application specific integrated circuit (ASIC) were combined in 1 irradiation campaign for Fusion for Energy (Barcelona, Spain). Radiation resistance of these ASICs, developed by Magics Instruments (Geel, Belgium) for Fusion for Energy, was assessed for a total ionizing dose (TID) above 1 MGy using the Co-60 gamma underwater irradiation test facility at SCK CEN (Mol, Belgium). The 3 different ASICs were irradiated at an average dose rate of 484 Gy/h and their performance was continuously measured (in-situ) during 97 irradiation days. A fully autonomous and modular test setup was developed to perform these measurements and ensure continuous operation by implementing a recovery and warning system in case of failure to restrict measurement data loss to minimum. An in-situ post-irradiation assessment was performed afterwards to observe recovery from the irradiation in a socalled annealing phase. Annealing was done for seven days at room temperature followed by another 7 days of high temperature annealing at 100 °C to accelerate the recovery effect. During the full test campaign all data was saved in a database, post-processed with Python into readable plots to deduct possible performance shifts due to the irradiation and afterwards during recovery. During the complete testing campaign of these ASICs the ESCC22900 (Total Dose Steady-State Irradiation Test Method) standard was followed.
format	article
author	Geys David Cao Ying Van Uffelen Marco Casellas Laura Mont Vermeeren Ludo Gusarov Andrei
author_facet	Geys David Cao Ying Van Uffelen Marco Casellas Laura Mont Vermeeren Ludo Gusarov Andrei
author_sort	Geys David
title	In-situ gamma irradiation testing of radiation hardened chips till 1 MGy
title_short	In-situ gamma irradiation testing of radiation hardened chips till 1 MGy
title_full	In-situ gamma irradiation testing of radiation hardened chips till 1 MGy
title_fullStr	In-situ gamma irradiation testing of radiation hardened chips till 1 MGy
title_full_unstemmed	In-situ gamma irradiation testing of radiation hardened chips till 1 MGy
title_sort	in-situ gamma irradiation testing of radiation hardened chips till 1 mgy
publisher	EDP Sciences
publishDate	2021
url	https://doaj.org/article/6894b9a6ceaf4cc7b85ec96ff60290a2
work_keys_str_mv	AT geysdavid insitugammairradiationtestingofradiationhardenedchipstill1mgy AT caoying insitugammairradiationtestingofradiationhardenedchipstill1mgy AT vanuffelenmarco insitugammairradiationtestingofradiationhardenedchipstill1mgy AT casellaslauramont insitugammairradiationtestingofradiationhardenedchipstill1mgy AT vermeerenludo insitugammairradiationtestingofradiationhardenedchipstill1mgy AT gusarovandrei insitugammairradiationtestingofradiationhardenedchipstill1mgy
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In-situ gamma irradiation testing of radiation hardened chips till 1 MGy

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