Misorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries
Grain boundaries can degrade the performance of electronic devices made from single atomic layers of transition metal dichalcogenides. Here, the authors combine transport measurements and transmission electron microscopy to find a correlation between field-effect mobility and grain misorientation an...
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| Auteurs principaux: | , , , , , , , , |
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| Format: | article |
| Langue: | EN |
| Publié: |
Nature Portfolio
2016
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| Sujets: | |
| Accès en ligne: | https://doaj.org/article/689dd66d07eb425aa63b1656d2d5c61d |
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| Résumé: | Grain boundaries can degrade the performance of electronic devices made from single atomic layers of transition metal dichalcogenides. Here, the authors combine transport measurements and transmission electron microscopy to find a correlation between field-effect mobility and grain misorientation angle. |
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