Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity

Abstract In many cases, electron counting with direct detection sensors offers improved resolution, lower noise, and higher pixel density compared to conventional, indirect detection sensors for electron microscopy applications. Direct detection technology has previously been utilized, with great su...

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Autores principales: James L. Hart, Andrew C. Lang, Asher C. Leff, Paolo Longo, Colin Trevor, Ray D. Twesten, Mitra L. Taheri
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/68b997663aa64bffadbb628d43c9d51b
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