Investigation of optical homogeneity of langasite samples

In the work langasite (LGS, La3Ga5SiO14) samples of different crystallographic orientations and forms were investigated to determine connection between optical heterogeneity and growing conditions. On the plates with two polished sides the interference pictures in bulk (IPB) of crystal were fou...

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Autores principales: Buzanov, O., Didenco, I., Kozlova, N., Zabelina, E.
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Lenguaje:EN
Publicado: D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2006
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Acceso en línea:https://doaj.org/article/6a06827c9be144fea145d86df69023ce
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spelling oai:doaj.org-article:6a06827c9be144fea145d86df69023ce2021-11-21T12:10:10ZInvestigation of optical homogeneity of langasite samples 2537-63651810-648Xhttps://doaj.org/article/6a06827c9be144fea145d86df69023ce2006-01-01T00:00:00Zhttps://mjps.nanotech.md/archive/2006/article/3415https://doaj.org/toc/1810-648Xhttps://doaj.org/toc/2537-6365In the work langasite (LGS, La3Ga5SiO14) samples of different crystallographic orientations and forms were investigated to determine connection between optical heterogeneity and growing conditions. On the plates with two polished sides the interference pictures in bulk (IPB) of crystal were found. The main reason of IPB is heterogeneity of refractive indices. It was established by research of form of the plates’ surfaces and absorption factor in various areas on a plate. The refractive index No and its dispersion were measured by method of a prism in range of wave lengths from 400 up to 800 nm, total measuring inaccuracy was less than 0,0001. It is possible to ascertain that heterogeneity of a refractive index along a direction of growth is much higher than in a perpendicular direction. Buzanov, O.Didenco, I.Kozlova, N.Zabelina, E.D.Ghitu Institute of Electronic Engineering and NanotechnologiesarticlePhysicsQC1-999ElectronicsTK7800-8360ENMoldavian Journal of the Physical Sciences, Vol 5, Iss 1, Pp 33-37 (2006)
institution DOAJ
collection DOAJ
language EN
topic Physics
QC1-999
Electronics
TK7800-8360
spellingShingle Physics
QC1-999
Electronics
TK7800-8360
Buzanov, O.
Didenco, I.
Kozlova, N.
Zabelina, E.
Investigation of optical homogeneity of langasite samples
description In the work langasite (LGS, La3Ga5SiO14) samples of different crystallographic orientations and forms were investigated to determine connection between optical heterogeneity and growing conditions. On the plates with two polished sides the interference pictures in bulk (IPB) of crystal were found. The main reason of IPB is heterogeneity of refractive indices. It was established by research of form of the plates’ surfaces and absorption factor in various areas on a plate. The refractive index No and its dispersion were measured by method of a prism in range of wave lengths from 400 up to 800 nm, total measuring inaccuracy was less than 0,0001. It is possible to ascertain that heterogeneity of a refractive index along a direction of growth is much higher than in a perpendicular direction.
format article
author Buzanov, O.
Didenco, I.
Kozlova, N.
Zabelina, E.
author_facet Buzanov, O.
Didenco, I.
Kozlova, N.
Zabelina, E.
author_sort Buzanov, O.
title Investigation of optical homogeneity of langasite samples
title_short Investigation of optical homogeneity of langasite samples
title_full Investigation of optical homogeneity of langasite samples
title_fullStr Investigation of optical homogeneity of langasite samples
title_full_unstemmed Investigation of optical homogeneity of langasite samples
title_sort investigation of optical homogeneity of langasite samples
publisher D.Ghitu Institute of Electronic Engineering and Nanotechnologies
publishDate 2006
url https://doaj.org/article/6a06827c9be144fea145d86df69023ce
work_keys_str_mv AT buzanovo investigationofopticalhomogeneityoflangasitesamples
AT didencoi investigationofopticalhomogeneityoflangasitesamples
AT kozlovan investigationofopticalhomogeneityoflangasitesamples
AT zabelinae investigationofopticalhomogeneityoflangasitesamples
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