Defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy

Photo-excited charge carrier dynamics in photocatalytic materials with rough surfaces have been studied via measurements using pattern-illumination time-resolved phase microscopy. Optimal defocusing is necessary for the phase-contrast detection of the refractive index change due to the photo-excited...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autores principales:	Kenji Katayama, Tatsuya Chugenji, Kei Kawaguchi
Formato:	article
Lenguaje:	EN
Publicado:	AIP Publishing LLC 2021
Materias:	Physics QC1-999
Acceso en línea:	https://doaj.org/article/6ab73b2e172243cbb73ea4a5504baf31
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

id	oai:doaj.org-article:6ab73b2e172243cbb73ea4a5504baf31
record_format	dspace
spelling	oai:doaj.org-article:6ab73b2e172243cbb73ea4a5504baf312021-12-01T18:52:06ZDefocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy2158-322610.1063/5.0072245https://doaj.org/article/6ab73b2e172243cbb73ea4a5504baf312021-11-01T00:00:00Zhttp://dx.doi.org/10.1063/5.0072245https://doaj.org/toc/2158-3226Photo-excited charge carrier dynamics in photocatalytic materials with rough surfaces have been studied via measurements using pattern-illumination time-resolved phase microscopy. Optimal defocusing is necessary for the phase-contrast detection of the refractive index change due to the photo-excited charge carriers. The signal enhancement of the phase-change was explained theoretically and experimentally. The optical phase variation due to the transmission of a rough surface is coupled with the quadratic phase term in Fresnel diffraction, and a slight defocusing can convert the phase image to the corresponding amplitude image. The phase-contrast image due to the photo-excited charge carriers is also enhanced by the defocusing. The explanation was supported by wave optics calculation, and the enhancement was demonstrated for two types of TiO2 substrates with different roughnesses.Kenji KatayamaTatsuya ChugenjiKei KawaguchiAIP Publishing LLCarticlePhysicsQC1-999ENAIP Advances, Vol 11, Iss 11, Pp 115215-115215-7 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Physics QC1-999
spellingShingle	Physics QC1-999 Kenji Katayama Tatsuya Chugenji Kei Kawaguchi Defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy
description	Photo-excited charge carrier dynamics in photocatalytic materials with rough surfaces have been studied via measurements using pattern-illumination time-resolved phase microscopy. Optimal defocusing is necessary for the phase-contrast detection of the refractive index change due to the photo-excited charge carriers. The signal enhancement of the phase-change was explained theoretically and experimentally. The optical phase variation due to the transmission of a rough surface is coupled with the quadratic phase term in Fresnel diffraction, and a slight defocusing can convert the phase image to the corresponding amplitude image. The phase-contrast image due to the photo-excited charge carriers is also enhanced by the defocusing. The explanation was supported by wave optics calculation, and the enhancement was demonstrated for two types of TiO2 substrates with different roughnesses.
format	article
author	Kenji Katayama Tatsuya Chugenji Kei Kawaguchi
author_facet	Kenji Katayama Tatsuya Chugenji Kei Kawaguchi
author_sort	Kenji Katayama
title	Defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy
title_short	Defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy
title_full	Defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy
title_fullStr	Defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy
title_full_unstemmed	Defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy
title_sort	defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy
publisher	AIP Publishing LLC
publishDate	2021
url	https://doaj.org/article/6ab73b2e172243cbb73ea4a5504baf31
work_keys_str_mv	AT kenjikatayama defocusinducedphasecontrastenhancementinpatternilluminationtimeresolvedphasemicroscopy AT tatsuyachugenji defocusinducedphasecontrastenhancementinpatternilluminationtimeresolvedphasemicroscopy AT keikawaguchi defocusinducedphasecontrastenhancementinpatternilluminationtimeresolvedphasemicroscopy
_version_	1718404696743346176

Defocus-induced phase contrast enhancement in pattern illumination time-resolved phase microscopy

Ejemplares similares