Direct measurements of interfacial adhesion in 2D materials and van der Waals heterostructures in ambient air
Here, the authors devise an experimental method based on atomic force microscopy to precisely measure the interfacial adhesion energy of layered materials, van der Waals heterostructures and two-dimensional materials on SiO2 substrates.
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| Autores principales: | , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2020
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/6bd261e4164346c29141ea91f3dae5be |
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