Native microdefects and as-grown dislocations in pure and doped InP crystals
The fine defect structure (native microdefects and as-grown dislocations) of pure and doped InP crystals are considered. Some kinds of point defects are detected. They are connected with the technology of crystal growth and impurity concentration. It is shown that the type and conce...
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| Autores principales: | , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
D.Ghitu Institute of Electronic Engineering and Nanotechnologies
2011
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/6cfa3ac716c145cbb06ee5646cd0f7e6 |
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