Magnification inferred curvature for real-time curvature monitoring

Abstract The in situ and real-time measurement of curvature changes of optically reflecting surfaces is a key element to better control bottom-up fabrication processes in the semiconductor industry, but also to follow or adjust mirror deformations during fabrication and use for space or optics indus...

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Détails bibliographiques
Auteurs principaux: Alexandre Arnoult, Jonathan Colin
Format: article
Langue:EN
Publié: Nature Portfolio 2021
Sujets:
R
Q
Accès en ligne:https://doaj.org/article/70043f881fba4b61bd17f230cd26d878
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